首页> 外国专利> CMOS-MEMS INTEGRATED DEVICE INCLUDING MULTIPLE CAVITIES AT DIFFERENT CONTROLLED PRESSURES AND METHODS OF MANUFACTURE

CMOS-MEMS INTEGRATED DEVICE INCLUDING MULTIPLE CAVITIES AT DIFFERENT CONTROLLED PRESSURES AND METHODS OF MANUFACTURE

机译:包括在不同控制压力下的多个腔的CMOS-MEMS集成器件及其制造方法

摘要

Integrated MEMS device the linking together and have that there are two shells between them in first substrate and the second substrate that include two substrates. First substrate and the second substrate include degasification source layer and adjust pressure in two shells except barrier layers. This method includes depositing and patterning degasification source layer and the first outlet barrier layer are on substrate, leading to two cross sections. The barrier layer and be encapsulated in the barrier layer of degasification in two section degasification source layers that degasification source layer is not degased on two sections. This method further include deposit with conformally one second degasification barrier etch second deaerate liner barrier layer, so as to this second except barrier layers side wall on leave except gas source bed.
机译:集成在一起的MEMS器件链接在一起,并在第一基板和第二基板之间的两个外壳之间具有两个外壳,其中包括两个基板。第一基板和第二基板包括脱气源层并且在除阻挡层之外的两个壳体中调节压力。该方法包括沉积和图案化脱气源层,并且第一出口阻挡层在基板上,导致两个横截面。阻挡层在两段脱气源层中被封装在脱气阻挡层中,即两段中不对脱气源层进行脱气。该方法还包括共形地沉积第二除气阻挡层以蚀刻第二除气衬里阻挡层,从而除气体源床外,在第二阻挡层侧壁上留下第二阻挡层。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号