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EMISSION LIFETIME MEASURING METHOD AND APPARATUS FOR MEASURING A MEAN LIFETIME OF ELECTRONICALLY EXCITED STATES

机译:测量电子激发态平均寿命的发射寿命测量方法和装置

摘要

An emission lifetime measuring method, in particular for measuring a mean lifetime of electronically excited states of a sample, comprises the steps of illuminating the sample with at least one excitation light pulse, time-resolved detecting an emission response from the sample and creating a temporal detector response function, and calculating the mean lifetime of the electronically excited states on the basis of the detector response function, wherein the at least one excitation light pulse is shaped such that the sample achieves an equilibrium excited steady-state including a linearly increasing or constant number of the electronically excited states, the detector response function has a linear response function section with a constant slope, and the mean lifetime (τ) of the electronically excited states is calculated on the basis of at least one of a time position of the linear response function section relative to a reference time of the at least one excitation light pulse and the slope of the linear response function section. Furthermore, an emission lifetime measuring apparatus (100) is described.
机译:一种发射寿命测量方法,特别是用于测量样品的电子激发态的平均寿命的方法,包括以下步骤:用至少一个激发光脉冲照射样品;时间分辨地检测样品的发射响应;以及产生时间检测器响应函数,并基于检测器响应函数计算电子激发态的平均寿命,其中至少一个激发光脉冲的形状应使样品达到包括线性增加或恒定的平衡激发稳态数个电子激发态,检测器响应函数具有线性斜率恒定的线性响应函数部分,并且基于线性的时间位置中的至少一个来计算电子激发态的平均寿命(τ)响应函数部分相对于至少一个激发光脉冲和线性响应函数部分的斜率。此外,描述了发射寿命测量设备(100)。

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