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COPPER ALLOY FOR ELECTRONIC/ELECTRICAL DEVICE, MEMBER FOR PLASTICALLY DEFORMING COPPER ALLOY FOR ELECTRONIC/ELECTRICAL DEVICE, COMPONENT FOR ELECTRONIC/ELECTRICAL DEVICE, TERMINAL, AND BUS BAR
COPPER ALLOY FOR ELECTRONIC/ELECTRICAL DEVICE, MEMBER FOR PLASTICALLY DEFORMING COPPER ALLOY FOR ELECTRONIC/ELECTRICAL DEVICE, COMPONENT FOR ELECTRONIC/ELECTRICAL DEVICE, TERMINAL, AND BUS BAR
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机译:电子/电气设备用铜合金,电子/电气设备用塑性变形铜合金,电子/电气设备,端子和母线的成分
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摘要
The present invention is characterized by containing 0.1 to less than 0.5 mass% of Mg, the balance being Cu and unavoidable impurities, and is further characterized in that in a tension test, when the ratio dà t /dµ t defined by true stress à t and true strain µ t is plotted on the vertical axis and true strain µ t is plotted on the horizontal axis, a strain region is included in which the gradient of dà t /dµ t is positive.
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机译:本发明的特征在于含有0.1质量%至小于0.5质量%的Mg,余量为Cu和不可避免的杂质,并且进一步的特征在于,在拉伸试验中,当由真实应力Δt定义的比率d / t / d / t时纵轴为真应变μt,横轴为真实应变μt,在应变区域中,d t /dμt的斜率为正。
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