首页> 外国专利> MICROMECHANICAL DETECTION STRUCTURE FOR A MEMS SENSOR DEVICE, IN PARTICULAR A MEMS GYROSCOPE, WITH IMPROVED DRIVING FEATURES

MICROMECHANICAL DETECTION STRUCTURE FOR A MEMS SENSOR DEVICE, IN PARTICULAR A MEMS GYROSCOPE, WITH IMPROVED DRIVING FEATURES

机译:具有改进的驱动功能的MEMS传感器设备(尤其是MEMS陀螺仪)的微机械检测结构

摘要

A micromechanical detection structure (20) comprises: a substrate (2) of semiconductor material; a driving-mass arrangement (4a-4c), coupled to a set of driving electrodes (7a-7c) and driven in a driving movement following upon biasing of the set of driving electrodes; a first anchorage unit (5a-5c, 6a-6c), coupled to the driving-mass arrangement for elastically coupling the driving-mass arrangement to the substrate (2) at first anchorages (5a-5c); a driven-mass arrangement (10, 30), elastically coupled to the driving-mass arrangement by a coupling unit (22a-22b) and designed to be driven by the driving movement; and a second anchorage unit (14, 34), coupled to the driven-mass arrangement for elastically coupling the driven-mass arrangement to the substrate (2) at second anchorages (17, 37). Following upon the driving movement, the resultant of the forces and of the torques exerted on the substrate (2) at the first and second anchorages is substantially zero.
机译:一种微机械检测结构(20),包括:半导体材料的衬底(2);驱动质量装置(4a-4c),其耦合到一组驱动电极(7a-7c),并在该组驱动电极偏置之后跟随驱动运动;第一锚固单元(5a-5c,6a-6c),其耦合至驱动质量装置,以在第一锚固(5a-5c)处将驱动质量装置弹性地耦合至基板(2);从动质量装置(10、30),其通过联接单元(22a-22b)弹性地联接到驱动质量装置,并被设计为由驱动运动驱动;第二锚固单元(14、34),其耦合到从动质量装置,以在第二锚固(17、37)处将从动质量装置弹性地耦合到基板(2)。在驱动运动之后,在第一和第二锚固处施加在基板(2)上的力和扭矩的合力基本上为零。

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