首页> 外国专利> MICROMECHANICAL DETECTION STRUCTURE FOR A MEMS SENSOR DEVICE, IN PARTICULAR A MEMS GYROSCOPE, WITH IMPROVED DRIVING FEATURES

MICROMECHANICAL DETECTION STRUCTURE FOR A MEMS SENSOR DEVICE, IN PARTICULAR A MEMS GYROSCOPE, WITH IMPROVED DRIVING FEATURES

机译:具有改进的驱动功能的MEMS传感器设备(尤其是MEMS陀螺仪)的微机械检测结构

摘要

A micromechanical detection structure includes a substrate of semiconductor material and a driving-mass arrangement is coupled to a set of driving electrodes and driven in a driving movement following upon biasing of the set of driving electrodes. A first anchorage unit is coupled to the driving-mass arrangement for elastically coupling the driving-mass arrangement to the substrate at first anchorages. A driven-mass arrangement is elastically coupled to the driving-mass arrangement by a coupling unit and designed to be driven by the driving movement. A second anchorage unit is coupled to the driven-mass arrangement for elastically coupling the driven-mass arrangement to the substrate at second anchorages. Following upon the driving movement, the resultant of the forces and of the torques exerted on the substrate at the first and second anchorages is substantially zero.
机译:一种微机械检测结构,包括半导体材料的基板,并且驱动质量装置耦合到一组驱动电极,并且在该组驱动电极偏置之后以驱动运动被驱动。第一锚固单元联接到驱动质量装置,以在第一锚固处将驱动质量装置弹性地联接到基板。从动装置通过耦合单元弹性地耦合到驱动装置,并且被设计成由驱动运动来驱动。第二锚固单元联接至从动质量布置,以用于在第二锚固处将从动质量布置弹性地联接至基板。在驱动运动之后,在第一和第二锚固处施加在基板上的力和扭矩的合力基本上为零。

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