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APPARATUS FOR THE DETECTION OF THE SURFACE PROFILE OF A SURFACE OF AN OBJECT USING INTERFEROMETRY DISTANCE MEASUREMENT

机译:用干涉测距法检测物体表面轮廓的装置

摘要

An arrangement for detecting the surface profile of an object surface by means of interferometric distance measurement, comprising a radiation source for generating monochromatic light; an optical arrangement, with which a first part of the light from each radiation source for reflection on a measuring area on the object surface is steerable and superimposed with another, not reflected on the object surface part of the light of the radiation source such that interference is generated; a detector arrangement for detecting the resulting light beams; and a signal evaluation unit for evaluating the thus detected interferometric signals; characterized in that the optical arrangement comprises means for separating a part of the light reflected from the same measuring area of the object surface from the radiation sources without interference; a detector arrangement is provided for detecting the non-interfering light beams; wherein the reflection signals generated by the detector arrangement for detecting the non-interfering light beams reflection signals of the signal evaluation unit can be fed.
机译:一种用于通过干涉测距法检测物体表面的表面轮廓的装置,包括用于产生单色光的辐射源;以及用于产生单色光的辐射源。一种光学装置,来自每个辐射源的用于在物体表面的测量区域上反射的光的第一部分是可操纵的,并且与另一部分重叠,而没有反射在辐射源的光的物体表面部分上,从而产生干涉产生;用于检测所得光束的检测器装置;信号评估单元,用于评估如此检测的干涉信号。其特征在于,该光学装置包括:用于将从物体表面的相同测量区域反射的一部分光与辐射源分离而没有干扰的装置;提供了一种用于检测非干扰光束的检测器装置;其中,可以馈送由检测器装置生成的用于检测信号分析单元的无干扰光束的反射信号的反射信号。

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