DYNAMIC PROBE, DYNAMIC MEASUREMENT SYSTEM AND METHOD FOR PROBING A DYNAMIC DATA SIGNAL

摘要

A dynamic probe (16) for probing a dynamic data signal comprising a switching unit (20) configured to provide at least two different input impedances, wherein the switching unit (20) is configured to select a first input impedance in a first mode and a second input impedance in a second mode, the switching unit (20) being configured to be operated dynamically based on an event in the data signal processed. Further, a dynamic measurement system (14) and a method for probing a dynamic data signal are described.