DYNAMIC PROBE, DYNAMIC MEASUREMENT SYSTEM AND METHOD FOR PROBING A DYNAMIC DATA SIGNAL

摘要

A dynamic probe for probing a dynamic data signal comprising a switching unit configured to provide at least two different input impedances, wherein the switching unit is configured to select a first input impedance in a first mode and a second input impedance in a second mode, the switching unit being configured to be operated dynamically based on an event in the data signal processed. Further, a dynamic measurement system and a method for probing a dynamic data signal are described.