首页> 外国专利> Object shape measuring method, object shape measuring apparatus, optical phase measuring method, and optical phase measuring apparatus

Object shape measuring method, object shape measuring apparatus, optical phase measuring method, and optical phase measuring apparatus

机译:物体形状测量方法,物体形状测量设备,光学相位测量方法和光学相位测量设备

摘要

PROBLEM TO BE SOLVED: To provide an object shape measurement method that enables a measurement of a surface shape of an object possible to contain a height difference exceeding a wavelength of light to be used without conducting phase connections.SOLUTION: From first object light and first reference light of a first wavelength including information on a surface shape of an object, a first interference fringe and second interference fringe are actually created, and a third interference fringe and fourth interference fringe are virtually created, and then, intensity distributions of these four interference fringes are obtained. From the intensity distributions of the four interference fringes, a first phase distribution is calculated that is included in the first object light. From second object light and second reference light of a second wavelength including information on a surface shape of an object, a fifth interference fringe and sixth interference fringe are actually created, and a seventh interference fringe and eighth interference fringe are virtually created, and then, intensity distributions of these four interference fringes are obtained. From the intensity distributions of the four interference fringes, a second phase distribution is calculated that is included in the second object light. From the first phase distribution and second phase distribution, a depth distribution is calculated that represents the surface shape of the object .SELECTED DRAWING: Figure 1
机译:解决的问题:提供一种物体形状测量方法,该方法能够在不进行相连接的情况下测量可能包含高度差的物体的表面形状,而无需进行相位连接。实际上产生包括关于物体的表面形状的信息的第一波长的参考光,第一干涉条纹和第二干涉条纹,并且虚拟地产生第三干涉条纹和第四干涉条纹,然后,这四个干涉的强度分布获得条纹。根据四个干涉条纹的强度分布,计算出包括在第一物体光中的第一相位分布。从包含与物体的表面形状有关的信息的第二波长的第二物体光和第二参考光实际创建第五干涉条纹和第六干涉条纹,并且虚拟地创建第七干涉条纹和第八干涉条纹,然后,得到这四个干涉条纹的强度分布。根据四个干涉条纹的强度分布,计算第二相位分布,该第二相位分布包括在第二物体光中。根据第一相分布和第二相分布,可以计算出代表物体表面形状的深度分布。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号