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Fine particle analyzer, observation device, fine particle analysis program, and fine particle analysis method

机译:微粒分析仪,观察装置,微粒分析程序以及微粒分析方法

摘要

A particle analysis apparatus includes: an acquisition unit that acquires a plurality of images each captured at a different time in each of which a particle moving in a predetermined direction in a medium is imaged; and a determination unit that determines, based on a movement amount of a particle due to Brownian motion in the medium, whether or not an image of a first particle included in an image captured at a first time of the plurality of images acquired by the acquisition unit and an image of a second particle included in an image captured at a second time which is different from the first time of the plurality of images acquired by the acquisition unit are images indicating the same particle.
机译:粒子分析装置包括:获取单元,其获取在不同时间捕获的多个图像,在每个图像中对在介质中沿预定方向移动的粒子进行成像。确定单元,其基于在介质中由于布朗运动引起的粒子的移动量来确定在通过获取获取的多个图像中的在第一时间捕获的图像中是否包括第一粒子的图像。在由获取单元获取的多个图像中的与第一时间不同的第二时间所捕获的图像中包括的第二粒子的图像是指示相同粒子的图像。

著录项

  • 公开/公告号JP6593174B2

    专利类型

  • 公开/公告日2019-10-23

    原文格式PDF

  • 申请/专利权人 株式会社ニコン;

    申请/专利号JP20150557828

  • 申请日2015-01-13

  • 分类号G01N15/14;G01N33/48;G01N33/483;

  • 国家 JP

  • 入库时间 2022-08-21 12:22:16

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