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THERMAL RESISTANCE MEASURING DEVICE AND THERMAL RESISTANCE MEASURING METHOD

机译:热阻测量装置和热阻测量方法

摘要

To make it possible to accurately and easily detect the thermal resistance between a junction and a case and the thermal resistance at the boundary between constitutional structures without using an expensive measuring instrument and software.SOLUTION: A thermal resistance measuring method includes: recording, in memory 5, two-system transient thermal resistance values (A, B) measured with the arrangement of a heat sink 3 with respect to (a junction of) an IC package 1 incorporated with an IC 2 in a first state and a second state; calculating, in a calculation unit 6, differential values of curves A, B of the transient thermal resistance; displaying, on a display unit 7, transient thermal resistance curves A, B and displaying, while overlapping on the display, changes (curves) of thermal resistance differential values that are results of differentiation of the curves A, B; and for example, visually recognizing and detecting the thermal resistance θjc between the junction and a case.SELECTED DRAWING: Figure 1
机译:无需使用昂贵的测量仪器和软件即可准确,轻松地检测接合处和壳体之间的热阻以及结构之间的热阻。解决方案:热阻测量方法包括:在内存中记录参照图5,在散热器3相对于以第一状态和第二状态结合有IC 2的IC封装1(的结)的布置中测量的两个系统的瞬态热阻值(A,B);在计算单元6中计算瞬态热阻的曲线A,B的差值;在显示单元7上显示瞬时热阻曲线A,B,并且在显示器上重叠的同时显示作为曲线A,B的微分结果的热阻微分值的变化(曲线);例如,从视觉上识别并检测结与外壳之间的热阻θjc。图1

著录项

  • 公开/公告号JP2019015564A

    专利类型

  • 公开/公告日2019-01-31

    原文格式PDF

  • 申请/专利权人 NEW JAPAN RADIO CO LTD;

    申请/专利号JP20170131964

  • 发明设计人 ARAKI CHIAKI;

    申请日2017-07-05

  • 分类号G01R31/26;

  • 国家 JP

  • 入库时间 2022-08-21 12:21:21

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