首页> 外国专利> Carrier for double-side polishing apparatus, double-side polishing apparatus and double-side polishing method

Carrier for double-side polishing apparatus, double-side polishing apparatus and double-side polishing method

机译:双面研磨装置用载体,双面研磨装置及双面研磨方法

摘要

The present invention relates to a double-side polishing apparatus for double-side polishing a semiconductor silicon wafer, the semiconductor silicon being disposed between upper and lower surface plates to which polishing cloths are respectively attached and sandwiched between the upper and lower surface plates during polishing. A carrier for a double-side polishing apparatus in which a holding hole for holding a wafer is formed, wherein the carrier for a double-side polishing apparatus is made of a resin, and an average value of contact angles with respect to pure water on the front and back surfaces contacting the polishing cloth Is a carrier for a double-side polishing apparatus in which the difference between the average contact angles of the front and back surfaces is within 5 °. This provides a carrier for a double-side polishing apparatus that can improve the polishing rate of a semiconductor silicon wafer using a resin carrier, a double-side polishing apparatus and a double-side polishing method using the same.
机译:双面抛光装置技术领域本发明涉及一种用于双面抛光半导体硅晶片的双面抛光装置,该半导体硅被布置在分别附着有抛光布的上下面板之间并且在抛光期间被夹在上下面板之间。 。用于双面抛光装置的载体,其中形成有用于保持晶片的保持孔,其中用于双面抛光装置的载体由树脂制成,并且相对于纯水的接触角的平均值接触抛光布的前表面和后表面是用于双面抛光设备的载体,其中前表面和后表面的平均接触角之差在5°以内。这提供了一种用于双面抛光设备的载体,其可以提高使用树脂载体的半导体硅晶片的抛光速率,该双面抛光设备和使用该载体的双面抛光方法。

著录项

  • 公开/公告号JPWO2018105306A1

    专利类型

  • 公开/公告日2019-10-24

    原文格式PDF

  • 申请/专利权人 信越半導体株式会社;

    申请/专利号JP20180554877

  • 发明设计人 田中 佑宜;北爪 大地;

    申请日2017-11-10

  • 分类号H01L21/304;B24B37/28;B24B37/08;B24B37;B24B57/02;

  • 国家 JP

  • 入库时间 2022-08-21 12:19:45

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