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Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through scan skewing
Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through scan skewing
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机译:通过扫描倾斜实现产品多重输入签名寄存器(OPMISR)中压缩模式的减少的扫描数据相互依赖性
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摘要
A method and circuit for implementing enhanced scan data testing with decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) testing through scan skewing, and a design structure on which the subject circuit resides are provided. The circuit is divided into multiple chiplets. Each chiplet includes a stump mux structure including multiple stump muxes connected in series, and a respective chiplet select is provided on shared scan inputs to respective chiplets. The chiplet select gates scan clocks, and when a chiplet is not selected the chiplet retains its data. The chiplet select enables test data to be skewed as scan data enters each chiplet.
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