Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through spreading in stumpmux daisy-chain structure

摘要

A method and circuit for implementing enhanced scan data testing with decreased scan data interdependence for compressed patterns in On Product Multiple Input Signature Register (OPMISR) testing through spreading in a stump mux data chain structure, and a design structure on which the subject circuit resides are provided. The stump mux chain structure includes a plurality of stump muxes connected in series by a respective rotation function. A respective exclusive OR (XOR) spreading function included with each of the plurality of stump muxes provides channel inputs. XOR inputs are applied to each XOR spreading function providing unique input combinations for each respective channel included with each of said plurality of stump muxes. The respective rotation function enables test data to be rotated as scan data enters each stump mux to further make the test data unique for each stump mux.