首页> 外国专利> Measurement apparatus and method that measure shape of surface while canceling cyclical errors to zero by summing of cyclic errors having different phases

Measurement apparatus and method that measure shape of surface while canceling cyclical errors to zero by summing of cyclic errors having different phases

机译:在通过将具有不同相位的周期性误差求和而将周期性误差消除为零的同时测量表面形状的测量装置和方法

摘要

The present invention provides a measurement apparatus for measuring a shape of a test surface, comprising an optical system configured to irradiate a measurement point on the test surface and a reference surface with light, and cause test light and reference light reflected to interfere with each other, a detector configured to detect an optical path length difference between the test light and the reference light by using interfering light and a processor configured to determine a position of the measurement point based on a plurality of detection results by the detector, wherein a detection result includes an error which cyclically changes, and the plurality of detection results include n detection results obtained in n states in which optical path lengths of the test light are different from each other by 1/n (n≥2) of a cycle of the error.
机译:本发明提供一种用于测量测试表面的形状的测量设备,该测量设备包括光学系统,该光学系统被配置为用光照射测试表面和参考表面上的测量点,并使测试光和反射的参考光彼此干涉。 ,检测器,被配置为通过使用干涉光来检测测试光与参考光之间的光程差,以及处理器,被配置为基于检测器的多个检测结果来确定测量点的位置,其中,检测结果包括周期性变化的误差,并且多个检测结果包括在n种状态下获得的n种检测结果,其中,测试光的光路长度彼此相差误差周期的1 / n(n≥2) 。

著录项

  • 公开/公告号US10260867B2

    专利类型

  • 公开/公告日2019-04-16

    原文格式PDF

  • 申请/专利权人 CANON KABUSHIKI KAISHA;

    申请/专利号US201514823209

  • 发明设计人 TAKAHIRO YAMAMOTO;

    申请日2015-08-11

  • 分类号G01B9/02;G01B11/24;G01B5/004;G01B11;

  • 国家 US

  • 入库时间 2022-08-21 12:15:32

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