首页> 外国专利> Device for correcting light absorption spectrum, method of manufacturing the device, and method of correcting light absorption spectrum

Device for correcting light absorption spectrum, method of manufacturing the device, and method of correcting light absorption spectrum

机译:用于校正光吸收光谱的装置,该装置的制造方法以及用于校正光吸收光谱的方法

摘要

Provided are light absorption spectrum correction devices, methods of manufacturing the light absorption spectrum correction devices, and methods of correcting a light absorption spectrum. The light absorption spectrum correction device includes: a light source configured to emit light; an attenuated total reflectance (ATR) crystal layer configured to contact a subject and provide an optical passage along which the light emitted from the light source travels to the subject; a pressure sensor configured to detect a contact pressure applied to the ATR crystal layer by the subject; a spectrum detector and analyzer configured to detect light emitted from the ATR crystal layer, form a light absorption spectrum based on the detected light, and determine an intensity of the light emitted from the ATR crystal layer; and a spectrum correction device configured to correct the light absorption spectrum based on the contact pressure.
机译:提供了光吸收光谱校正装置,制造该光吸收光谱校正装置的方法以及校正光吸收光谱的方法。吸光光谱校正装置包括:被配置为发光的光源;以及衰减全反射(ATR)晶体层,其配置为接触对象并提供光通道,从光源发出的光沿着该光通道传播到对象;压力传感器,其被配置为检测对象施加到ATR晶体层的接触压力;光谱检测器和分析器,被配置为检测从ATR晶体层发射的光,基于检测到的光形成光吸收光谱,并确定从ATR晶体层发射的光的强度;光谱校正装置,其根据接触压力来校正光吸收光谱。

著录项

  • 公开/公告号US10362996B2

    专利类型

  • 公开/公告日2019-07-30

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号US201514818485

  • 发明设计人 SANGKYU KIM;JOONHYUNG LEE;SEONGHO CHO;

    申请日2015-08-05

  • 分类号A61B5;G01N21/23;G01N21/35;G01N21/552;

  • 国家 US

  • 入库时间 2022-08-21 12:15:29

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号