首页> 外国专利> Time delay integration image capture method correcting image defects caused by cosmic particles

Time delay integration image capture method correcting image defects caused by cosmic particles

机译:时延积分图像捕获方法校正宇宙粒子引起的图像缺陷

摘要

To eliminate image defects produced by high-energy particles passing through a time delay integration image sensor, upstream detection is effected on the digital values supplied by the pixels of the same rank that have successively observed the same scene point. This detection makes it possible to ignore or to correct values from corrupted pixels in establishing the digital signal representing the luminance of an observed scene point. Detection is based on the calculation of the difference between a first digital value pi,a(t1) and a second digital value pi,b(t2) supplied by two pixels Pxi,a and Pxi,b that have observed the same scene point, subtracting the second value from the first, and comparing it to a predetermined threshold k. If this difference is above the threshold, the first value is too high, the first value is ignored in the summation Σ′i effected to establish the luminance of the scene point, replacing this value with the second value to which it has been compared. Alternatively it is replaced by a mean value or excluded from the calculation.
机译:为了消除由高能粒子通过延时积分图像传感器产生的图像缺陷,对连续观察相同场景点的相同等级像素提供的数字值进行上游检测。该检测使得在建立表示观察到的场景点的亮度的数字信号时可以忽略或校正来自损坏像素的值。检测基于对第一数字值p i,a (t 1 )和第二数字值p i,b 之间的差的计算。由观察到相同场景点的两个像素Px i,a 和Px i,b 提供的Sub>(t 2 )减去第二值与第一值比较,并将其与预定阈值k进行比较。如果此差高于阈值,则第一个值太高,在求和Σ' i 的总和中忽略了第一个值,以建立场景点的亮度,将其替换为第二个值与之比较。或者,将其替换为平均值或从计算中排除。

著录项

  • 公开/公告号US10313566B2

    专利类型

  • 公开/公告日2019-06-04

    原文格式PDF

  • 申请/专利权人 E2V SEMICONDUCTORS;

    申请/专利号US201515328968

  • 发明设计人 PIERRE FEREYRE;PHILIPPE MOENNE-LOCCOZ;

    申请日2015-07-23

  • 分类号H04N5/217;H04N5/357;H04N5/374;

  • 国家 US

  • 入库时间 2022-08-21 12:11:48

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