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System for determining at least one property of a sheet dielectric sample using terahertz radiation
System for determining at least one property of a sheet dielectric sample using terahertz radiation
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机译:使用太赫兹辐射确定片状电介质样品至少一种特性的系统
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摘要
A system for determining at least one property of a sheet dielectric sample using terahertz radiation includes at least one terahertz transmitter configured to output a pulse of terahertz radiation, a terahertz receiver configured to receive at least a portion of the pulse of terahertz radiation, wherein the terahertz receiver is configured to output a measured waveform based on the terahertz radiation received by the terahertz receiver, and a control unit in communication with the terahertz receiver. Wherein the control unit is configured to choose at least one region of interest of the measured waveform, compare the at least one region of interest of the measured waveform to a model waveform, vary at least one parameter of a model waveform to minimize the difference between the model waveform and the measured waveform.
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