首页> 外国专利> METHOD, APPARATUS AND COMPUTER PROGRAM FOR MEASURING AND PROCESSING A SPECTRUM OF AN XUV LIGHT SOURCE FROM SOFT X-RAYS TO INFRARED WAVELENGTH

METHOD, APPARATUS AND COMPUTER PROGRAM FOR MEASURING AND PROCESSING A SPECTRUM OF AN XUV LIGHT SOURCE FROM SOFT X-RAYS TO INFRARED WAVELENGTH

机译：用于测量和处理从软X射线到红外波长的XUV光谱的方法，装置和计算机程序

页面导航

摘要
著录项
相似文献

摘要

Method for measuring and processing by means of a broadband spectrometer (1) a spectrum of light (7) generated by an XUV source for generating light in a wavelength range from soft x-rays to infrared wavelengths, wherein the processing is based on the assessment of a wavelength range in the measured spectrum which has a negligible higher order contribution to longer-wavelengths than said range.

机译：通过宽带光谱仪（ 1 ）测量和处理XUV光源产生的光谱（ 7 ）的光谱的方法，该光谱用于产生软x波长范围内的光-射线至红外波长，其中所述处理基于对所测光谱中的波长范围的评估，该波长范围对更长波长的可忽略的更高阶贡献比所述范围大。 展开▼

著录项

公开/公告号US2019271586A1

专利类型

公开/公告日2019-09-05

原文格式PDF

申请/专利权人 UNIVERSITEIT TWENTE;
展开▼

申请/专利号US201716347683

发明设计人 MUHARREM BAYRAKTAR;FREDERIK BIJKERK;HUBERTUS MARIA JACOBUS BASTIAENS;CASPER BRUINEMAN;
展开▼

申请日2017-11-03

分类号G01J1/42;G01J3/28;G01J3/18;

国家 US

入库时间 2022-08-21 12:06:13

相似文献

专利

外文文献

中文文献

1. 测量和处理从软X射线到红外波长的XUV光源的光谱的方法、设备和计算机程序 [P] . 中国专利： CN110062876A . 2019-07-26

2. 一种用于物质识别的多波长近红外光谱测量装置 [P] . 中国专利： CN106841105B . 2019.08.06

3. Method, apparatus and computer program for measuring and processing spectrum of XUV light source from soft x-ray to infrared wavelength [P] . 韩国专利： KR20190079633A . 2019-07-05

机译：测量和处理从软x射线到红外波长的xuv光源光谱的方法，装置和计算机程序

4. Method, apparatus and computer program for measuring and processing the spectrum of an XUV light source from soft X-rays to infrared wavelengths [P] . 日本专利： JP2019537008A . 2019-12-19

机译：用于测量和处理从软X射线到红外波长的XUV光源光谱的方法，装置和计算机程序

5. METHOD, APPARATUS AND COMPUTER PROGRAM FOR MEASURING AND PROCESSING A SPECTRUM OF AN XUV LIGHT SOURCE FROM SOFT X-RAYS TO INFRARED WAVELENGTHS [P] . 欧洲知识产权局专利： EP3535552A1 . 2019-09-11

机译：用于测量和处理从软X射线到红外波长的XUV光源光谱的方法，装置和计算机程序

1. Development and application of the new BPM system data processing program at Hefei light source [J] . MA Tianji, YANG Yongliang, SUN Baogen, 核技术（英文版） . 2012,第005期

2. Patent Issued for Memory Mapping System, Request Controller,Multi-Processing Arrangement, Central Interrupt Request Controller, Apparatus, Method for Controlling Memory Access and Computer Program Pr [J] . Journal of Engineering . 2013,第13期

3. LASERIX: An open facility for developments of EUV and soft X-ray lasers and applications-Developments of XUV sources using high power laser facilities: ILE, ELI [J] . D. Ros, K. Cassou, B. Cros, Nuclear Instruments & Methods in Physics Research . 2011,第1期

4. DEVELOPMENT OF A METHOD AND APPARATUS FOR MEASURING THE LIGHT-REFLECTING CHARACTERISTICS OF INFRARED OPTOELECTRONIC SYSTEMS [J] . N. V. Baryshnikov, R. O. Stepanov Measurement techniques . 2007,第9期

5. Research on the measuring method of the slope error of EUV/X-ray optical elements and measuring apparatus of long trace profiler [C] . Xue Changxi, Huo Furong, Zhou Chengzhi, International Symposium on Advanced Optical Manufacturing and Testing Technologies; 20070708-12; Chengdu(CN) . 2007

6. Metoda merenja talasne du?ine monohromatske svetlosti primenom spektralno osetljivih opti?kih komponenti =Method of Measuring Monochromatic Light Wavelength by Using Wavelength Sensitive Optical Components [D] . Jo?a, Ana. 2019

7. Reliability of lower limb alignment measures using an established landmark-based method with a customized computer software program [O] . Elizabeth A. Sled, Lisa M. Sheehy, David T. Felson, -1

8. Method and apparatus for vibration detection, method and apparatus for vibration analysis, lithographic apparatus, device manufacturing method, and computer program [O] . Haico Victor Kok 2008

9. A STUDY OF X-RAY EMISSION FROM GALACTIC AND EXTRAGALACTIC SOURCES WITH EMPHASIS ON SOFT AND ULTRA-SOFT WAVELENGTHS [R] . C. S. Bowyer 1974

1. 近红外光谱预处理及波长选择方法 [C] . 李艳坤 . 第十六届全国分子光谱学学术会议 . 2010

2. 化学计量学方法用于重整汽油近红外光谱的数据处理和西红花分子的构效关系研究 [A] . 孟秀红 . 2003