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OPHTHALMOLOGIC DEVICE AND PUPIL STATE MEASURING METHOD

机译:眼科设备和小学生状态测量方法

摘要

To provide an ophthalmologic device and a pupil state measuring method capable of securing accuracy of a measurement result of objective measurement and effective for investigating the cause of an error during objective measurement. A pupil state measuring method according to the present invention includes: an ocular characteristic measuring step of objectively measuring an ocular characteristic of a subject eye of a subject; an imaging step of substantially simultaneously imaging an anterior ocular segment of the subject eye from different directions using at least two imaging units in measuring the ocular characteristic; a measuring step of analyzing at least one image of images taken by the at least two imaging units to measure a pupil state of the subject eye; and a step of performing the imaging step and the measuring step in measuring the ocular characteristic.
机译:提供一种眼科设备和瞳孔状态测量方法,其能够确保客观测量的测量结果的准确性并且对于调查客观测量期间的错误原因有效。根据本发明的瞳孔状态测量方法包括:眼睛特性测量步骤,其客观地测量对象的被检眼的眼睛特性;以及成像步骤,在测量眼部特征时,使用至少两个成像单元基本上同时从不同方向对被检眼的前眼部进行成像。测量步骤,分析由至少两个成像单元拍摄的图像的至少一个图像,以测量被检眼的瞳孔状态;在进行眼特性的测定时,进行摄像步骤和测定步骤。

著录项

  • 公开/公告号US2019090736A1

    专利类型

  • 公开/公告日2019-03-28

    原文格式PDF

  • 申请/专利权人 TOPCON CORPORATION;

    申请/专利号US201816144842

  • 发明设计人 MASASHI NAKAJIMA;

    申请日2018-09-27

  • 分类号A61B3/11;A61B3/103;

  • 国家 US

  • 入库时间 2022-08-21 12:05:53

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