Provided is an X-ray optical device for use in X-ray analysis systems. The X-ray optical device (100, 100a) comprises: an X-ray source (1100) configured to emit X-rays; an X-ray optics (1200) configured to image a beam (240) of X-rays generated by the X-ray source (1100) onto a sample (300) to be analysed; and a beam blocking unit (1300) arranged for selectively blocking off at least a portion of the X-ray beam (240) output by the X-ray optics (1200). The beam blocking unit (1300) comprises a rotating shaft (1310) and a beam blocking element (1320), wherein the rotating shaft (1310) is rotatable around its axis and arranged laterally offset with respect to the X-ray beam (240) output by the X-ray optics (1200), and wherein the beam blocking element (1320) is mounted eccentrically on the rotating shaft (1310) such that the beam blocking element (1320) is movable into different beam overlap positions for blocking off corresponding portions of the output X-ray beam (240) when the beam blocking element (1320) is eccentrically rotated around the rotating shaft axis (1312). Also provided is an X-ray analysis system for analysing crystalline or powder samples, comprising the above X-ray optical device (110, 110a), a sample stage (120) and an X-ray detector (130).
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