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X-RAY DETECTION OF X-RAY INCIDENT FRINGE PATTERN IN PHASE-CONTRAST AND/OR DARK-FIELD X-RAY IMAGING

机译:相衬和/或暗场X射线成像中X射线入射条纹图案的X射线检测

摘要

In a conventional phase-contrast X-ray imaging system, a source grating G0 generates an array of partially coherent line sources which illuminate an object and thereafter phase grating G1. The periodicity in the phase grating is self-imaged at certain instances further away from the X-ray source and sampled by a mechanically movable third absorptive analyzer grating G2 before the demodulated fringe intensity is detected by a conventional X-5 ray detector. This application proposes to directly demodulate the fringe intensity using a structured scintillator having a plurality of slabs in alignment with sub-pixels of an optical detector layer, in combination with electronic signal read-out approaches. Therefore, a mechanically movable third absorptive analyzer grating G2 can be omitted from a phase-contrast X-ray imaging system.
机译:在常规的相衬X射线成像系统中,源光栅G0产生照明物体的部分相干线源的阵列,然后产生相光栅G1。在某些情况下,相位光栅中的周期性是自成像的,离X射线源更远,并由机械移动的第三吸收分析器光栅G2进行采样,然后再由常规X-5射线检测器检测出条纹的强度。本申请提出结合电子信号读出方法,使用具有多个与光学检测器层的子像素对准的平板的结构化闪烁体来直接解调条纹强度。因此,可以从相衬X射线成像系统中省略机械可移动的第三吸收分析仪光栅G2。

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