X-ray detection of X-ray incident fringe pattern in phase-contrast and/or dark-field X-ray imaging

摘要

In a conventional phase-contrast X-ray imaging system, a source grating G0 generates an array of partially coherent line sources which illuminate an object and thereafter phase grating G1. The periodicity in the phase grating is self-imaged at certain instances further away from the X-ray source and sampled by a mechanically movable third absorptive analyzer grating G2 before the demodulated fringe intensity is detected by a conventional X-5 ray detector. This application proposes to directly demodulate the fringe intensity using a structured scintillator having a plurality of slabs in alignment with sub-pixels of an optical detector layer, in combination with electronic signal read-out approaches. Therefore, a mechanically movable third absorptive analyzer grating G2 can be omitted from a phase-contrast X-ray imaging system.