SYSTEM AND METHOD FOR DETERMINING CHARACTERISTIC VALUES OF AMETROPIA OF A TEST PERSON

摘要

The invention relates to a system (36) for determining characteristic values of ametropia of a test person, comprising a device (38) for generating optical test structures (12) and a device (42) for observing the test structures (12) by the test person, said device comprising a correction unit (60) for correcting possible ametropia phenomena of the test person. According to the invention, the optical test structures (12) have at least two moving speckle patterns (14, 16) of different wavelengths. The invention further relates to a corresponding device (38) for generating optical test structures (12) for determining characteristic values of ametropia of a test person, and to a corresponding method for determining characteristic values of ametropia of a test person.