PRISM COUPLING METHODS OF CHARACTERIZING STRESS IN GLASS-BASED ION-EXCHANGED ARTICLES HAVING PROBLEMATIC REFRACTIVE INDEX PROFILES

摘要

The prism coupling methods disclosed herein are directed to determining a stress characteristic of an original IOX article having a buried IOX region with a buried refractive index profile that is problematic in the sense that it prevents the original IOX article from being measured using a prism coupler system. The methods include modifying the buried IOX region of the original IOX article in a surface portion of the buried IOX region to form a modified IOX article having an unburied refractive index profile that allows the modified IOX article to be measured using a prism coupler. The methods also include measuring a mode spectrum of the modified IOX article using the prism coupler system. The methods further include determining one or more stress characteristic of the original IOX article from the mode spectrum of the modified IOX article.