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METHOD FOR CONTINUOUSLY DETERMINING ALL OF THE COMPONENTS OF THE RESISTANCE TENSOR OF THIN FILMS
METHOD FOR CONTINUOUSLY DETERMINING ALL OF THE COMPONENTS OF THE RESISTANCE TENSOR OF THIN FILMS
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机译:连续测定薄膜电阻张量的所有成分的方法
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摘要
The invention relates to a method for continuously determining all the components of the resistance tensor of thin films, such as thin film resistors and thin film sensors of all types. The invention is to provide a method for continuously determining all of the components of the resistance tensor of thin films, such as thin film resistors and thin film sensors of all types, wherein a continuous determination of all the components of the resistance tensor is facilitated without switching the contact points using a minimum number of contacts. This is achieved in that a homogeneous thin film part (T) of any shape is provided with at least three contact points (Ki to K3) arranged at distances from one another. An input voltage Ui(t) is applied at each of the contact points (K1 to K3), the currents Ii(t) flowing through the contact points (K1 to K3) are detected, and the complete resistance tensor p of the thin film part (T) is determined from the voltage and current values.
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机译:本发明涉及一种连续确定薄膜电阻张量的所有分量的方法,例如所有类型的薄膜电阻器和薄膜传感器。本发明提供了一种用于连续确定薄膜的电阻张量的所有分量的方法,诸如所有类型的薄膜电阻器和薄膜传感器,其中便于连续确定电阻张量的所有分量。使用最少数量的触点切换触点。这是通过在任意形状的均质薄膜部分(T)上设置至少三个接触点(K i Sub>至K 3 Sub>)来实现的,该至少三个接触点彼此间隔一距离。另一个。在每个接触点(K 1 Sub>至K 3 Sub>)上施加输入电压 U I> i Sub>(t) ),检测流过接触点(K 1 Sub>到K 3 Sub>)的电流I i Sub>(t),并完成电阻张量薄膜部分(T)的 p I>由电压和电流值确定。
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