首页> 外国专利> AQUEOUS POLISHING COMPOSITION AND PROCESS FOR CHEMICALLY MECHANICALLY POLISHING SUBSTRATES CONTAINING SILICON OXIDE DIELECTRIC AND POLYSILICON FILMS

AQUEOUS POLISHING COMPOSITION AND PROCESS FOR CHEMICALLY MECHANICALLY POLISHING SUBSTRATES CONTAINING SILICON OXIDE DIELECTRIC AND POLYSILICON FILMS

机译:包含氧化硅介电膜和多晶硅膜的化学机械抛光基体的水性抛光成分和工艺

摘要

The present invention is directed to an aqueous polishing composition comprising: (A) abrasive cerium oxide particles; And (B) an amphipathic nonionic surfactant selected from water-soluble and water-dispersible, linear and branched polyoxyalkylene block copolymers of formula (I) R [(B1) m / ( B2) n Y] p (I), Wherein the exponents and variables have the following meanings: m, n and p are integers of 1 or more; R is a monovalent or polyvalent organic residue other than a C 5 -C 20 alkyl group or a hydrogen atom; (B1) is a block of oxyethylene monomer units; (B2) is a substituted oxyalkylene group in which the substituent is selected from two methyl groups, alkyl groups with more than two carbon atoms and cycloalkyl, aryl, alkyl-cycloalkyl, alkyl-aryl, cycloalkyl-aryl and alkyl- A block of monomeric units; Y is a monovalent organic residue other than a C 5 -C 20 alkyl group or a hydrogen atom; However, when (B) contains more than one block (B1) or (B2), two blocks of the same type are separated by different types of blocks.
机译:本发明涉及一种含水抛光组合物,其包含:(A)磨料氧化铈颗粒;和(B)一种两亲性非离子表面活性剂,选自式(I) R [(B1)m /( B2)n Y] p的水溶性和水分散性,直链和支链的聚氧化烯嵌段共聚物(I)其中,指数和变量具有以下含义:m,n和p为1或更大的整数; R是除C 5 -C 20 烷基或氢原子以外的一价或多价有机残基; (B1)是氧乙烯单体单元的嵌段; (B2)是取代的氧化烯基,其中取代基选自两个甲基,具有两个以上碳原子的烷基和环烷基,芳基,烷基-环烷基,烷基-芳基,环烷基-芳基和烷基-单位; Y是除C 5 -C 20 烷基或氢原子以外的一价有机残基;但是,当(B)包含一个以上的块(B1)或(B2)时,两个相同类型的块将由不同类型的块分隔开。

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