IC IC IC Apparatus method and system for testing integrated circuit chip

摘要

A scan test is performed in which a scan pattern is input to a scan path through a scan input port of an IC chip including a circuit to be tested and an output value outputted through a scan output port is compared with a predetermined predicted value to check whether or not an IC chip is defective An IC chip testing apparatus for performing a shift test shifts a target scan section to be searched for usable shift frequencies among at least two or more scan sections included in a set of scan patterns by a scan path so that a shift frequency And a shift frequency search unit for searching for the shift frequency. The shift frequency search unit may increase or decrease the shift frequency of the target scan section in the shift frequency search for the target scan section differently from at least one of the other scan sections that shift in the scan path, And searches for a shift frequency whose scan test result is normal or failed.