首页> 外国专利> ELECTROSTATIC CHUCK HAVING ETCHING PROCESS MONITORING AND SELF-MONITORING FUNCTION AND ETCHING PROCESS EQUIPMENT WITH SAME

ELECTROSTATIC CHUCK HAVING ETCHING PROCESS MONITORING AND SELF-MONITORING FUNCTION AND ETCHING PROCESS EQUIPMENT WITH SAME

机译:具有相同的蚀刻过程监控和自我监控功能的静电卡盘和蚀刻过程设备

摘要

An electrostatic chuck having an etching process monitoring and self-monitoring function includes: a support unit supporting a substrate; an electrostatic electrode provided on the support unit, supplied with electric power from an electrostatic chuck power supply unit to chuck and dechuck the substrate, and receiving a RF signal; a process monitoring circuit receiving the RF signal from the electrostatic electrode and measuring an electrical parameter included in the RF signal; and a control unit receiving the electrical parameter from the process monitoring circuit and monitoring an etching degree of the substrate and presence or absence of abnormality of the support unit based on the electrical parameter.;COPYRIGHT KIPO 2019
机译:一种具有蚀刻过程监测和自我监测功能的静电吸盘,包括:支撑单元,其支撑基板。设置在支撑单元上的静电电极,该静电电极从静电吸盘供电单元提供电力以吸盘和解吸基板,并接收RF信号;处理监视电路从静电电极接收RF信号并测量RF信号中包括的电参数;控制单元;和控制单元,其从所述过程监视电路接收所述电参数,并基于所述电参数来监视所述基板的蚀刻程度以及所述支撑单元的有无异常。

著录项

  • 公开/公告号KR20190048413A

    专利类型

  • 公开/公告日2019-05-09

    原文格式PDF

  • 申请/专利权人 NP HOLDINGS CO. LTD.;

    申请/专利号KR20170143349

  • 发明设计人 CHOI DAI KYUKR;

    申请日2017-10-31

  • 分类号H01L21/683;H01J37/32;H01L21/66;H01L21/67;

  • 国家 KR

  • 入库时间 2022-08-21 11:51:02

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