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Defect review sampling and normalization based on defect and design attributes

机译:基于缺陷和设计属性的缺陷检查采样和归一化

摘要

Decision trees and normalized reclassifications are used to classify defects. Defect review sampling and normalization can be used for accurate Pareto ranking and defect source analysis. A defect review system, such as a broadband plasma tool and controller, can be used to bin defects using a decision tree based on defect attributes and design attributes. The class codes are assigned to at least some of the defects in each bin. The normalized reclassification assigns a class code to any unclassified defects in the bin. An additional decision tree may be used if any bean has more than one class code after normalized reclassification.
机译:决策树和规范化的重分类用于对缺陷进行分类。缺陷检查采样和归一化可用于准确的Pareto排名和缺陷源分析。诸如宽带等离子工具和控制器之类的缺陷检查系统可以用于基于缺陷属性和设计属性的决策树来对缺陷进行分类。将分类代码分配给每个仓中的至少一些缺陷。归一化的重新分类将分类代码分配给料箱中任何未分类的缺陷。如果在归一化的重新分类之后,任何bean具有一个以上的类代码,则可以使用其他决策树。

著录项

  • 公开/公告号KR20190055851A

    专利类型

  • 公开/公告日2019-05-23

    原文格式PDF

  • 申请/专利权人 케이엘에이-텐코 코포레이션;

    申请/专利号KR20197013678

  • 发明设计人 용 포 분;

    申请日2017-10-13

  • 分类号H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-21 11:50:51

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