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SIMIRALITY DETERMING APPARATUS OF SUBSYSTEM INDULDED IN A MODEL AND SIMIRALTIY DETERMINING METHOD FOR THE SAME
SIMIRALITY DETERMING APPARATUS OF SUBSYSTEM INDULDED IN A MODEL AND SIMIRALTIY DETERMINING METHOD FOR THE SAME
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机译：模型中包含的子系统的相似性确定装置及其相似性确定方法
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摘要
According to one embodiment of the present invention, provided is a method for measuring similarity of a subsystem in a model, which comprises the steps of: hierarchically classifying subsystems in a model; measuring similarity between the subsystems configured with functional blocks; and setting the same subsystems as libraries as a result of the similarity measurement.
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