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Precision alignment system and alignment method of substrate and mask

机译:基板与掩模的精密对准系统及对准方法

摘要

Disclosed is a precise alignment system of a substrate and a mask. The precise alignment system of the substrate and the mask according to the present invention comprises a stage unit provided with a clamping module for clamping the substrate. A stage position adjusting unit connected to the stage unit to move the stage unit relative to the mask, a load sensing unit provided in the clamping module and sensing a load of the substrate applied to the clamping module, and electrically connected to the load sensing unit. And a control unit that calculates the maximum deflection point of the substrate based on the information about the load of the substrate received from the sensing unit and controls the positioning unit based on the calculated maximum deflection point of the substrate.
机译:公开了一种基板和掩模的精确对准系统。根据本发明的基板和掩模的精确对准系统包括台单元,该台单元具有用于夹持基板的夹持模块。台位置调节单元,其连接到台单元以使台单元相对于掩模移动;负载感测单元,其设置在夹持模块中并感测施加到夹持模块的基板的负载,并且电连接至负载感测单元。控制单元基于从感测单元接收到的关于基板的载荷的信息来计算基板的最大挠曲点,并且基于所计算的基板的最大挠曲点来控制定位单元。

著录项

  • 公开/公告号KR101966133B1

    专利类型

  • 公开/公告日2019-08-13

    原文格式PDF

  • 申请/专利权人 주식회사 에스에프에이;

    申请/专利号KR20170074857

  • 发明设计人 김인문;김준수;민지홍;

    申请日2017-06-14

  • 分类号H01L21/68;H01L21/67;H01L21/687;

  • 国家 KR

  • 入库时间 2022-08-21 11:48:52

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