首页> 外国专利> 2 ASSEMBLY FOR PROVIDING AN ALIGNED STACK OF TWO OR MORE MODULES AND A LITHOGRAPHY SYSTEM OR A MICROSCOPY SYSTEM COMPRISING SUCH AN ASSEMBLY

2 ASSEMBLY FOR PROVIDING AN ALIGNED STACK OF TWO OR MORE MODULES AND A LITHOGRAPHY SYSTEM OR A MICROSCOPY SYSTEM COMPRISING SUCH AN ASSEMBLY

机译:2用于提供两个或多个模块的对齐堆叠的组件,以及包含此类组件的光刻系统或显微镜系统

摘要

The present invention preferably relates to an assembly for providing a correctly aligned stack of two or more modules in a stacking direction, for use in a lithography system or a microscopy system. Each of the two or more modules includes three support members. The assembly includes a frame having three flat alignment surfaces extending in the stacking direction and angularly offset relative to one another. Further, when arranged in the frame, each of the three support members of each of the two or more modules borders on a corresponding one of the three alignment surfaces. The frame is provided with an opening between two of the three flat alignment surfaces for inserting the module into the assembly, and the two flat alignment surfaces on either side of the opening are at least partially facing the opening.
机译:本发明优选地涉及一种用于在光刻系统或显微镜系统中使用的组件,该组件用于在堆叠方向上提供两个或更多个模块的正确对准的堆叠。两个或更多模块中的每个模块均包含三个支撑构件。该组件包括框架,该框架具有在堆叠方向上延伸并且相对于彼此成角度地偏移的三个平坦对准表面。此外,当布置在框架中时,两个或更多个模块中的每个模块的三个支撑构件中的每个在三个对准表面中的相应一个上边界。框架在三个平面对准表面中的两个之间设有用于将模块插入组件的开口,并且在开口的任一侧上的两个平面对准表面至少部分地面向开口。

著录项

  • 公开/公告号KR102029973B1

    专利类型

  • 公开/公告日2019-10-08

    原文格式PDF

  • 申请/专利权人 에이에스엠엘 네델란즈 비.브이.;

    申请/专利号KR20147009692

  • 发明设计人 카펠호프 피테르;

    申请日2012-09-12

  • 分类号H01J37/317;G03F7/20;H01J37/067;H01J37/20;

  • 国家 KR

  • 入库时间 2022-08-21 11:47:37

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