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PARTICLE WORKING DEVICE WITH A RAY OF LOADED PARTICLES AND METHOD FOR CORRECTING ABERRATIONS OF THE PARTICLES WORKING WITH THE RADIATION WORKING DEVICE

机译:带有一束负载粒子的粒子工作装置和校正与辐射工作装置工作的粒子的偏差的方法

摘要

In a charged particle beam apparatus using a multipole aberration corrector, the charged particle beam fast aberration correction apparatus is designed to include: a charged particle source having a primary beam generates charged particles, an aberration correction optical system that corrects aberrations of the charged particle charged particle beam of the primary charged particle, a detection unit that detects secondary charged particles generated from a sample irradiated with the primary charged particle beam, the detection element of which Aberrations were corrected by the optical aberration correction system, an image forming unit that generates a charged particle image of the sample from a signal obtained by detecting the secondary charged particles by the detection unit, an aberration tion correction amount calculating unit that processes the charged particle image generated by the image forming unit, separates aberrations having different symmetries in the primary charged particle beam, selects aberrations to be preferentially corrected from the separated aberrations, and the amount of correction of the optical aberration correction system for correction of the selected aberration, and an optical aberration correcting system control unit that controls the optical aberration correcting system on the basis of the correction amount calculated by the aberration correction amount calculating unit.
机译:在使用多极像差校正器的带电粒子束装置中,带电粒子束快速像差校正装置被设计为包括:具有主光束的带电粒子源产生带电粒子;校正带电的带电粒子的像差的像差校正光学系统。一次带电粒子束的粒子束,检测单元,该单元检测从用一次带电粒子束照射的样品产生的二次带电粒子,该检测元件的像差由光学像差校正系统校正,图像形成单元生成从通过检测单元检测二次带电粒子而获得的信号中获得样品的带电粒子图像,像差校正量计算单元处理由图像形成单元生成的带电粒子图像,从而在一次带电中分离具有不同对称性的像差。党派光束,从分离的像差中选择要优先校正的像差,以及用于校正所选择的像差的光学像差校正系统的校正量,以及基于该像差校正系统控制单元来控制光学像差校正系统的单元。由像差校正量计算单元计算出的校正量。

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