Socket for testing electronic components and test site facility

摘要

A pedestal (400) for testing electronic components, the pedestal (400) comprising: a plurality of force-measuring pairs (100), each force-measuring pair (100) having a force contact spring (110) and a measuring force spring (120 ), wherein the force of contact spring (110) and the measuring contact spring (120) adjacent to each other, and wherein at least one of the force contact spring (110) and the measuring contact spring (120) is coated with an electrically insulating coating, where the Force contact spring (110) and the measuring contact spring (120) abut each other.