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1.
Neutron Induced Single Event Upset (SEU) Testing of Static Random Access Memory (SRAM) Devices
机译:
中子引起的静态随机存取存储器(SRAM)器件的单事件翻转(SEU)测试
作者:
Tostanoski Michael J.
;
Deaton Terrence F.
;
Strayer Roy E.
;
Goldflam Rudolf
;
Fullem Travis Z.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
SRAM chips;
digital signal processing chips;
integrated circuit testing;
neutron sources;
radiation effects;
radiation hardening (electronics);
DSP;
GSI GS816273CC;
Galvantech;
SEU testing;
SM32C6713BGDPA20EP;
Texas Instruments;
bit pattern;
datasheet;
digital signal processor;
iRAM;
internal RAM;
irradiation;
neutron cross section;
neutron induced single event upset;
neutron source;
polyethylene moderator;
read/write correct loop;
static random access memory;
synchronous burst SRAM device;
units-under-test;
Neutrons;
Nio;
2.
Radiation Effects in Thermal Image Sensors for Earth Observation Missions
机译:
用于地球观测任务的热图像传感器中的辐射效应
作者:
Gomez Rojas Luis
;
Clatworthy Tom
;
Skipper Mark
;
Chang Mingchao
;
Nelms Nick
;
Perez Albinana Abelardo
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
Earth;
image sensors;
infrared imaging;
radiation hardening (electronics);
reliability;
Cobalt60;
ESA EarthCARE mission;
Earth observation mission;
LET;
SEL;
ULIS UL03041 thermal infrared image sensor;
heavy ion irradiation;
radiation effect;
reliability;
Arrays;
Detectors;
Performance evaluation;
Radiation effects;
Temperature measurement;
Tin;
3.
Radiation Tolerance Assessment of Commercial ZigBee Wireless Modules
机译:
商业ZigBee无线模块的耐辐射性评估
作者:
Gomaa R.
;
Adly I.
;
Sharshar K.
;
Safwat A.
;
Ragai Hani
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
Zigbee;
radiation monitoring;
wireless sensor networks;
WSN deployment;
commercial ZigBee wireless modules;
gamma irradiation fluxes;
nuclear embedded applications;
nuclear environment monitoring;
radiation tolerance assessment;
wireless sensor networks;
Monitoring;
Power generation;
Programming;
Radiation effects;
Wireless communication;
Wireless sensor networks;
Zigbee;
4.
SEE Test Results for P2020 and P5020 Freescale Processors
机译:
针对P2020和P5020飞思卡尔处理器的SEE测试结果
作者:
Guertin Steven M.
;
Amrbar Mehran
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
radiation hardening (electronics);
P2020;
P5020;
SEE test results;
cache upsets;
freescale processors;
heavy ion;
memory controller upsets;
proton testing;
register bit upsets;
Computer crashes;
Program processors;
Protons;
Registers;
Sensitivity;
Testing;
5.
SEE Testing Results for RF and Microwave ICs
机译:
射频和微波IC的SEE测试结果
作者:
Chukov George V.
;
Elesin Vadim V.
;
Nazarova Galina N.
;
Nikiforov Alexander Y.
;
Boychenko Dmitry V.
;
Telets Vitaliy /A/.
;
Kuznetsov Alexander G.
;
Amburkin Konstantin M.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
integrated circuit design;
microwave integrated circuits;
radiation hardening (electronics);
RF integrated circuits;
SEE testing results;
SPELS test center;
microwave IC;
single event effects;
CMOS integrated circuits;
Microwave FET integrated circuits;
Microwave amplifiers;
Microwave circuits;
Microwave integrated circuits;
Microwave oscillators;
Radiation effects;
6.
Accelerator-Based Neutron Irradiation of Integrated Circuits at GENEPI2 (France)
机译:
GENEPI2上基于加速器的集成电路中子辐照(法国)
作者:
Villa Federica
;
Baylac Maud
;
Rey Solenne
;
Rossetto Olivier
;
Mansour Wassim
;
Ramos Pablo
;
Velazco Raoul
;
Hubert Guillaume
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
SRAM chips;
digital integrated circuits;
GENEPI2;
SRAM;
accelerator facility;
accelerator-based neutron irradiation;
electron volt energy 15 MeV;
electron volt energy 3 MeV;
integrated circuits;
Detectors;
Integrated circuits;
Neutrons;
Particle beams;
Production;
Protons;
Radiation effects;
7.
Altitude and Underground Real-Time SER Testing of SRAMs Manufactured in CMOS Bulk 130, 65 and 40 nm
机译:
CMOS批量130、65和40 nm中制造的SRAM的高度和地下实时SER测试
作者:
Autran Jean-Luc
;
Munteanu Daniela
;
Sauze S.
;
Gasiot Gilles
;
Roche Philippe
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
CMOS memory circuits;
SRAM chips;
integrated circuit reliability;
integrated circuit testing;
life testing;
radiation hardening (electronics);
ASTEP;
CMOS manufacturing;
LSM;
SRAM;
altitude SEE test European platform;
complementary metal oxide semiconductor;
mountain altitude;
radiation data;
real-time SER testing;
reliability technique;
size 130 nm;
size 40 nm;
size 65 nm;
soft error sensitivity;
soft-error rate;
static random access memory;
underground laboratory of Modane;
Atmospheric measurements;
CMOS integrated c;
8.
Analysis of Geostationary and Polar Orbit Space Environment Data Processed by the Russian Federal Space Agency (Roscosmos) Monitoring System
机译:
俄罗斯联邦航天局(Roscosmos)监测系统处理的对地静止和极地轨道空间环境数据分析
作者:
Anashin Vasily S.
;
Protopopov Grigory /A/.
;
Shatov Pavel /A/.
;
Tasenko Sergey V.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
aerospace instrumentation;
computerised monitoring;
data analysis;
space vehicles;
spectrometers;
AX8;
AX9;
CRRESELE;
JPL;
Nymmik;
Psychic;
Roscosmos monitoring system;
Rosenquist;
Russian Federal Space Agency monitoring system;
flight data;
geostationary data analysis;
polar orbit space environment data analysis;
solar particles space models;
spacecrafts;
spectrometers;
Atmospheric measurements;
Correlation;
Electron traps;
Monitoring;
Orbits;
Protons;
Space vehicles;
9.
Commercial Light Emitting Diodes Sensitivity to Protons Radiations: IEEE Radiation Effects Data Workshop Record
机译:
商业发光二极管对质子辐射的敏感性:IEEE辐射效应数据研讨会记录
作者:
Boutillier M.
;
Gilard O.
;
Quadri G.
;
Lhuillier S.
;
How L.S.
;
Hernandez S.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
integrated optoelectronics;
light emitting diodes;
luminescence;
COTS;
I-V characteristics;
IEEE Radiation Effects Data Workshop Record;
commercial light emitting diodes sensitivity;
commercial off-the-shelf LED;
electron volt energy 50 MeV;
emission spectra;
light output;
protons radiations;
space applications;
Gallium arsenide;
Light emitting diodes;
Power generation;
Protons;
Radiation effects;
Robustness;
10.
Compendium of Ball Aerospace TID, DDD, and SEE Test Results
机译:
球形航空航天TID,DDD和SEE测试结果简编
作者:
Horton R.H.
;
Oldham T.R.
;
Lee Jeyull
;
Davies R.R.
;
Koga R.
;
Chen D.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
radiation hardening (electronics);
testing;
DDD test;
SEE test;
ball aerospace TID compendium;
ball aerospace systems;
displacement damage dose;
single event transient;
total ionizing dose;
Dielectrics;
Ions;
Metals;
Operational amplifiers;
Testing;
Transient analysis;
Xenon;
11.
Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics
机译:
候选粒子加速器电子的辐射诱导效应简编
作者:
Oser P.
;
Spiezia G.
;
Brugger M.
;
Danzeca S.
;
Fadakis E.
;
Foucard G.
;
Garcia Alia R.
;
Losito R.
;
Masi A.
;
Mekki J.
;
Peronnard P.
;
Ruggiero G.
;
Secondo R.
;
Stachyra K.
;
Gaillard R.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
Degradation;
MOSFET;
Neutrons;
Protons;
Radiation effects;
Regulators;
Voltage control;
12.
Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial and Radiation Tolerant Operational Amplifiers
机译:
商用和耐辐射运算放大器的单事件闩锁和总电离剂量测试结果纲要
作者:
Irom Farokh
;
Agarwal Shri G.
;
Amrbar Mehran
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
operational amplifiers;
radiation hardening (electronics);
NASA spacecraft;
commercial operational amplifiers;
compendium reports;
radiation tolerant operational amplifiers;
single-event latchup;
total ionizing dose test;
Conferences;
Degradation;
Laboratories;
Operational amplifiers;
Performance evaluation;
Radiation effects;
Temperature measurement;
13.
Effect of D-T Fusion-Produced Neutron Irradiation on X-Ray Spectral Characteristics of PIPS Detectors
机译:
D-T融合产生的中子辐照对PIPS探测器的X射线光谱特性的影响
作者:
Vigneshwara Raja P.
;
Narasimha Murty Neti V. L.
;
Rao C.V.S.
;
Abhangi Mitul
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
silicon radiation detectors;
D-T fusion-produced neutron irradiation;
D-T generator;
PIPS detectors;
detector characteristics;
detector resolution;
electrical spectral characteristics;
leakage current;
x-ray spectral characteristics;
Detectors;
Energy resolution;
Leakage currents;
Neutrons;
Radiation effects;
Silicon;
Temperature measurement;
14.
ELDRS Characterization of Texas Instruments LM185, 1.2V Precision Reference: Retrograde Behavior Demonstrates Why Taking Interim Test Points Is Important
机译:
德州仪器(TI)LM185的ELDRS表征,精度为1.2V:逆行行为说明了为什么采用临时测试点很重要
作者:
Kruckmeyer Kirby
;
Thang Trinh
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
radiation hardening (electronics);
testing;
ELDRS characterization;
LM185 reference voltage;
Texas Instruments LM185 precision reference;
biased test conditions;
enhanced low dose rate sensitivity characterization;
high dose rates;
interim test points;
low dose rates;
recovery curve;
retrograde behavior;
total ionizing dose radiation;
unbiased test conditions;
voltage 1.2 V;
Breakdown voltage;
Military standards;
Radiation effects;
Temperature distribution;
Test facilities;
Voltage measurement;
15.
FEAST2: A Radiation and Magnetic Field Tolerant Point-of-Load Buck DC/DC Converter
机译:
FEAST2:耐辐射和磁场的负载点降压DC / DC转换器
作者:
Faccio F.
;
Blanchot G.
;
Fuentes C.
;
Michelis S.
;
Orlandi S.
;
Saggini S.
;
Troyano I.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
CMOS integrated circuits;
DC-DC power convertors;
integrated circuit design;
magnetic field measurement;
magnetic fields;
particle detectors;
ASIC design;
CERN;
FEAST2;
LHC accelerator;
displacement damage;
electrical characterization;
hardness-by-design techniques;
high voltage CMOS technology;
magnetic field tolerant point-of-load buck DC-DC converter;
particles detectors;
power 10 W;
radiation tolerant point-of-load buck DC-DC converter;
Application specific integrated circuits;
Detectors;
Inductors;
Radiation ef;
16.
Femtosecond Laser Simulation Facility for SEE IC Testing
机译:
飞秒激光仿真设备,用于SEE IC测试
作者:
Egorov Andrey N.
;
Chumakov Alexander /I/.
;
Mavritskiy Oleg B.
;
Pechenkin Alexander /A/.
;
Savchenkov Dmitriy V.
;
Telets Vitaliy /A/.
;
Yanenko Andrey V.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
integrated circuit testing;
radiation hardening (electronics);
SEE IC testing;
femtosecond laser simulation facility;
laser pulse duration;
single event effect;
tunable pulse duration;
Integrated circuits;
Laser beams;
Laser modes;
Measurement by laser beam;
Radiation effects;
Semiconductor lasers;
Ultrafast optics;
17.
Floating Gate P-MOS Radiation Sensor Charging Cycles Characterization
机译:
浮栅P-MOS辐射传感器充电周期特性
作者:
Cesari J.
;
Gomez David
;
Roca M.
;
Isern E.
;
Pineda A.
;
Garcia-Moreno E.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
CMOS integrated circuits;
MOSFET;
radiation detection;
reliability;
CMOS technology;
automated measurement system;
charging cycle characterization;
floating gate P-MOS radiation sensor;
floating gate discharge;
recharging cycle characterization;
reliability;
Charge measurement;
Degradation;
Discharges (electric);
MOSFET;
Temperature measurement;
Temperature sensors;
18.
Intensity Upgrade to the TRIUMF 500 MeV Large-Area Neutron Beam
机译:
强度升级到TRIUMF 500 MeV大面积中子束
作者:
Blackmore Ewart W.
;
Trinczek Michael
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
neutron sources;
particle beam diagnostics;
FLUKA calculations;
TRIUMF BL1B neutron-proton facility;
TRIUMF large-area neutron beam;
activation measurements;
collimated beams;
device testing;
neutron;
neutron energy spectrum;
neutron intensities;
neutron production converter;
systems testing;
transverse profiles;
Collimators;
Monitoring;
Neutrons;
Particle beams;
Protons;
Radiation effects;
Testing;
19.
Laser Pulse Tests of Bipolar Junction Transistors (BJTs) for SET Analysis
机译:
用于SET分析的双极结型晶体管(BJT)的激光脉冲测试
作者:
Daniel C.
;
Plettner C.
;
Schuttauf A.
;
Poivey C.
;
Tonicello F.
;
Triggianese M.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
analogue circuits;
bipolar transistors;
radiation hardening (electronics);
sensitivity;
BJT;
EADS Innovation Works in Sureness;
PSPICE;
SET shapes;
analogue single event upset;
base junction;
collector junction;
discrete bipolar junction transistors;
internal structure;
laser pulse tests;
operating conditions;
single event transient sensitivity;
Current measurement;
Integrated circuits;
Measurement by laser beam;
Pulse measurements;
Semiconductor lasers;
Sensitivity;
Transistors;
20.
Simulation of Single Event Effects and Rate Prediction: CODES an ESA Tool
机译:
单事件效果和速率预测的仿真:使用ESA工具进行编码
作者:
Keating Ana
;
Coutinho Sergio
;
Goncalves Patricia
;
Zadeh Ali
;
Pimenta Mario
;
Daly Eamonn
;
Martins Joao
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
circuit simulation;
radiation hardening (electronics);
sensitivity analysis;
CODES tool;
EEE devices;
ESA GEANT4 based top level engineering tool;
ESA tool;
PHP server;
component degradation simulation;
data analysis;
device geometry definition;
device sensitivity interpretation;
device sensitivity simulation;
experimental test data;
inter-modular communication;
pre-processor;
rate prediction;
single event effect simulation;
Accuracy;
Computational modeling;
Data models;
Ions;
Performance evaluation;
Sensitivity;
Solid;
21.
Single Event Effects Characterization of Texas Instruments ADC12D1600CCMLS, 12 Bit, 3.2 GSPS Analog-to-Digital Converter with Static and Dynamic Inputs
机译:
德州仪器(TI)ADC12D1600CCMLS,具有静态和动态输入的12位,3.2 GSPS模数转换器的单事件效果表征
作者:
Kruckmeyer Kirby
;
Thang Trinh
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
analogue-digital conversion;
radiation hardening (electronics);
SEU testing;
Texas Instruments ADC12D1600CCMLS;
analog-to-digital converter;
conversion rates;
dynamic inputs;
heavy ion testing;
ion energy;
single event effects characterization;
single event functional interrupt;
single event latch-up;
single event upset;
static inputs;
word length 12 bit;
Clocks;
Monitoring;
Registers;
Single event upsets;
Temperature measurement;
Temperature sensors;
Testing;
22.
Single-Event Characterization of the 28 nm Xilinx Kintex-7 Field-Programmable Gate Array under Heavy Ion Irradiation
机译:
重离子辐照下28 nm Xilinx Kintex-7现场可编程门阵列的单事件表征
作者:
Lee David S.
;
Wirthlin Michael
;
Swift Gary
;
Le Anthony C.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
SRAM chips;
field programmable gate arrays;
flip-flops;
radiation hardening (electronics);
BlockRAM memory;
Xilinx Kintex-7 FPGA;
Xilinx Kintex-7 field-programmable gate array;
configuration SRAM cells;
heavy ion irradiation;
single-event effect characterization;
single-event response;
singleevent latch-up signature;
size 28 nm;
user-accessible flip-flop cells;
Field programmable gate arrays;
Flip-flops;
Monitoring;
Rails;
Single event upsets;
Temperature measurement;
Testing;
23.
Swift Heavy Ion Irradiation Capabilities at the National Superconducting Cyclotron Laboratory at Michigan State University
机译:
密歇根州立大学国家超导回旋加速器实验室的快速重离子辐照能力
作者:
Stolz A.
;
Bollen G.
;
Leitner D.
;
Mittig W.
;
Pellemoine F.
;
Ronningen R.
;
Steiner Matthias
会议名称:
《》
|
2014年
关键词:
cyclotrons;
Michigan State University;
hydrogen;
material science;
national superconducting cyclotron laboratory;
single-event effect testing;
swift heavy ion irradiation capabilities;
uranium;
Cyclotrons;
Ion beams;
Ions;
Isotopes;
Particle separators;
Radiation effects;
24.
The New Gamma Irradiation Facility at the National Research Nuclear University MEPhI
机译:
国立研究核大学MEPhI的新型伽马辐照设备
作者:
Artamonov Alexey S.
;
Sangalov Anton /A/.
;
Nikiforov Alexander Y.
;
Telets Vitaliy /A/.
;
Boychenko Dmitry V.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
gamma-ray production;
radioactive sources;
MEPhI;
National Research Nuclear University;
gamma irradiation facility;
Biology;
Concrete;
Educational institutions;
Instruments;
Laboratories;
Radiation effects;
Standards;
25.
The Behavior of SEE Sensitivity at Various TID Levels
机译:
不同TID级别的SEE敏感性行为
作者:
Novikov Alexander /A/.
;
Pechenkin Alexander /A/.
;
Chumakov Alexander /I/.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
radiation hardening (electronics);
sensitivity analysis;
SEE;
SEL;
SET;
SEU;
TID levels;
laser technique;
sensitivity behavior;
single event effects;
single event transient;
single event upset;
CMOS integrated circuits;
Measurement by laser beam;
Radiation effects;
Random access memory;
Semiconductor lasers;
Sensitivity;
X-ray lasers;
26.
TID Test Results of Optical Materials and Photodiodes for SIS Instrument (Dreams Project)
机译:
SIS仪器的光学材料和光电二极管的TID测试结果(Dreams项目)
作者:
Alvarez M.
;
Hernando C.
;
Jimenez J.J.
;
Alvarez F.J.
;
Martin I.
;
Escribano D.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
dosimetry;
integrated optics;
integrated optoelectronics;
optical filters;
optical glass;
optical testing;
photodiodes;
sun sensors;
Delrin;
Dreams project;
EXOMARS 2016;
SIS instrument;
TID test;
Teflon;
optical filter glasses;
optical materials;
photodiodes;
sensitivity;
solar irradiance sensor;
total dose sensitivity;
Degradation;
Instruments;
Optical filters;
Optical materials;
Photodiodes;
Radiation effects;
27.
TID Response of a Hybrid AMR Vector Magnetometer
机译:
混合AMR矢量磁强计的TID响应
作者:
Whiteside Barry J.
;
Brown Patrick
;
Beek Trevor J.
;
Horbury Tim S.
;
Carr Christopher M.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
ceramics;
enhanced magnetoresistance;
magnetic field measurement;
magnetic sensors;
magnetometers;
magnetoresistive devices;
H-bridge drive;
TID response;
anisotropic magnetoresistance;
cofired ceramic chip;
hybrid AMR vector magnetometer;
three-axis vector magnetoresistive hybrid MAGIC;
Magnetic sensors;
Magnetometers;
Radiation effects;
Sensor phenomena and characterization;
Space vehicles;
Temperature sensors;
28.
Total Ionizing Dose Characterization of 65 nm Flash-Based FPGA
机译:
基于65 nm闪存的FPGA的总电离剂量表征
作者:
Rezzak Nadia
;
Jih-Jong Wang
;
Chang-Kai Huang
;
Nguyen Victor
;
Bakker Gregory
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
field programmable gate arrays;
flash memories;
system-on-chip;
SoC;
device level;
field programmable gate array;
product level;
size 65 nm;
smart fusion 2 flash-based FPGA;
system-on-chip capability;
total ionizing dose characterization;
Degradation;
Field programmable gate arrays;
Logic gates;
MOS devices;
Nonvolatile memory;
Radiation effects;
Transistors;
29.
Total Ionizing Dose Effects on Commercial Electronics for Cube Sats in Low Earth Orbits
机译:
低地球轨道上的立方体卫星对商业电子的总电离剂量效应
作者:
Netzer Richard
;
Avery Keith
;
Kemp William
;
Vera Alonzo
;
Zufelt Brian
;
Alexander David
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
artificial satellites;
integrated circuits;
candidate commercial microcircuits;
commercial electronics;
high dose rate testing;
low dose rate testing;
low earth orbits;
short cube sat missions;
total ionizing dose effects;
Bones;
CMOS integrated circuits;
Microcontrollers;
Operational amplifiers;
Performance evaluation;
Ports (Computers);
Radiation effects;
30.
Low Energy Protons at RADEF - Application to Advanced eSRAMs
机译:
RADEF的低能质子-应用于高级eSRAM
作者:
Kettunen Heikki
;
Ferlet-Cavrois Veronique
;
Roche Philippe
;
Rossi Mattia
;
Bosser Alexandre
;
Gasiot Gilles
;
Guerre Francois-Xavier
;
Jaatinen Jukka
;
Javanainen Arto
;
Lochon Frederic
;
Virtanen Ari
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
SRAM chips;
calibration;
dosimetry;
radiation hardening (electronics);
RADEF;
calibration;
dosimetry;
eSRAM;
embedded SRAM;
external users;
low energy proton facility;
memory test vehicles;
proton energy selection;
single event upset measurements;
size 28 nm;
test vehicles;
Atmospheric measurements;
Calibration;
Detectors;
Magnetic flux;
Magnetic separation;
Particle beams;
Protons;
31.
Radiation Effects Characterization of a High Density SSRAM
机译:
高密度SSRAM的辐射效应表征
作者:
Hafer C.
;
Mabra J.
;
Mnich C.
;
Leslie M.
;
Jordan A.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
SRAM chips;
radiation hardening (electronics);
SEL;
TID;
bit rate 64 Mbit/s;
bit rate 80 Mbit/s;
bit rate 96 Mbit/s;
error rate;
high density SSRAM;
radiation effects characterization;
total ionizing dose;
Oscillators;
Phase locked loops;
Radiation effects;
Single event upsets;
Synchronization;
Xenon;
32.
New Gamma-Radiation Facility for Device Testing in Spain
机译:
西班牙用于设备测试的新型伽马辐射设施
作者:
Morilla Y.
;
Muniz G.
;
Dominguez Manuel
;
Martin Patrick
;
Jimenez Joaquin
;
Praena J.
;
Munoz Eugenio
;
Sanchez-Angulo C.I.
;
Fernandez George
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
aerospace instrumentation;
RADLAB;
Spain;
device testing;
gamma-radiation facility;
space missions;
Dosimetry;
Laboratories;
Monitoring;
Radiation effects;
Standards;
Temperature measurement;
33.
Radiation Performance of Interline CCD Arrays
机译:
线间CCD阵列的辐射性能
作者:
Thompson Dennis /A/.
;
Fodness Bryan C.
;
Lee Paul P. K.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
CCD image sensors;
electron traps;
focal planes;
protons;
radiation detection;
charge to voltage conversion;
charge transfer efficiency;
dark current;
electron volt energy 12 MeV;
electron volt energy 30 MeV;
electron volt energy 50 MeV;
focal plane array;
gamma radiation;
interline CCD array;
nonoperational pixel;
particle energy;
proton;
radiation performance;
trapped noise electron;
Arrays;
Charge coupled devices;
Dark current;
Hardware;
Noise;
Protons;
Testing;
34.
SEE Results of a Next Generation LEON 3FT Microprocessor
机译:
查看下一代LEON 3FT微处理器的结果
作者:
Hafer C.
;
Guertin Steven M.
;
Baranski B.
;
Butler G.
;
Nagy J.
;
Griffith S.
;
Jordan A.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
SRAM chips;
fault tolerance;
microprocessor chips;
radiation hardening (electronics);
SEE results;
SEL immunity;
SEU test software;
TID results;
fault tolerant circuitry;
internal SRAM;
next generation LEON 3FT microprocessor;
Fault tolerance;
Fault tolerant systems;
Random access memory;
Registers;
Software;
Springs;
Testing;
35.
Roscosmos Test Facilities for Total Ionizing Dose Testing of Electronic Component
机译:
Roscosmos测试设备,用于电子组件的总电离剂量测试
作者:
Petrov Alexander S.
;
Tapero Konstantin /I/.
;
Ulimov Viktor N.
;
Anashin Vasily S.
;
Chubunov Pavel /A/.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
radiation effects;
space vehicle electronics;
test facilities;
Roscosmos test facility;
electronic component;
space application;
total ionizing dose testing method;
Annealing;
Electronic components;
Heating;
Radiation effects;
Temperature measurement;
Test facilities;
36.
A Total Ionizing Dose Dataset for Vertical NPN Transistors
机译:
垂直NPN晶体管的总电离剂量数据集
作者:
Adams Dennis /A/.
;
Barnes Herbert /A/.
;
Goldstein Norman P.
;
Harms David C.
;
Horner Jereimah J.
;
Sherman Cory E.
;
Stodart Craig
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
BiCMOS integrated circuits;
bipolar transistors;
radiation hardening (electronics);
semiconductor device models;
semiconductor device testing;
BiCMOS processing technology;
TID;
base doping concentration;
device modeling;
device operating currents;
mixed signal applications;
radiation hardened processing technology;
total dose degradation;
total ionizing dose dataset;
vertical NPN bipolar transistors;
voltage 10 V;
voltage 40 V;
Annealing;
BiCMOS integrated circuits;
Bipolar transistors;
Degradation;
Radiation effec;
37.
Analysis of Space Environment Measurement Carried out by the Roscosmos Monitoring System Elements
机译:
Roscosmos监测系统元件进行的空间环境测量分析
作者:
Anashin Vasily S.
;
Protopopov Grigory /A/.
;
Kozyukova Olga S.
;
Binyukov Pavel V.
;
Polinkin Alexey P.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
MOSFET;
aerospace instrumentation;
data analysis;
sensors;
space vehicles;
Roscosmos monitoring system elements;
TID sensor;
flight data;
space environment measurement;
total ionizing dose sensors data analysis;
Data models;
Extraterrestrial measurements;
Monitoring;
Orbits;
Sensor phenomena and characterization;
Space vehicles;
38.
Characterization and Analyses of RadHard-By-Design CMOS Open Drain Quad Comparators
机译:
RadHard-By-Design CMOS开漏四通道比较器的特性与分析
作者:
Benson Ray
;
Resch Paul
;
Milanowski Randall
;
Swonger James
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
CMOS analogue integrated circuits;
comparators (circuits);
integrated circuit design;
radiation hardening (electronics);
RadHard-by-design CMOS open drain quad comparators;
SPICE simulation analyses;
characterization data;
radiation hardening;
single event effects;
single event transient response;
total ionizing dose;
CMOS integrated circuits;
Electronic mail;
Radiation effects;
SPICE;
Testing;
Transient analysis;
Voltage measurement;
39.
Charged Particle Induced Degradation of Trench Type n-Channel Power MOSFETs
机译:
沟槽型n沟道功率MOSFET的带电粒子诱导降解
作者:
Koga R.
;
Bielat S.
;
George Jinto
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
gamma-rays;
power MOSFET;
protons;
sensitivity analysis;
SEB;
SEGR;
charged particle induced degradation;
gamma-ray TID effects;
heavy ions;
microdose effects;
protons;
radiation sensitivity;
trench type n-channel power MOSFET;
Degradation;
Gamma-rays;
Ions;
MOSFET;
Protons;
Radiation effects;
Sensitivity;
40.
Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA
机译:
单一事件影响,总电离剂量和NASA候选航天器电子的位移损伤简编
作者:
LaBel Kenneth /A/.
;
OBryan Martha V.
;
Dakai Chen
;
Campola Michael J.
;
Casey Megan C.
;
Pellish Jonathan /A/.
;
Lauenstein Jean-Marie
;
Wilcox Edward P.
;
Topper Alyson D.
;
Ladbury Raymond L.
;
Berg Melanie D.
;
Gigliuto Robert /A/.
;
Boutte Alvin J.
;
Cochran Do
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
radiation hardening (electronics);
semiconductor device testing;
space vehicle electronics;
NASA;
TID;
candidate spacecraft electronics;
displacement damage;
heavy ion induced SEE;
national aeronautics and space administration;
proton-induced DD;
radiation effect;
single event effect;
total ionizing dose;
CMOS integrated circuits;
Protons;
Schottky diodes;
Silicon;
Testing;
Voltage measurement;
Xenon;
41.
Design and Radiation Hardness of Next Generation Solar UV Radiometers
机译:
下一代太阳紫外线辐射计的设计和辐射硬度
作者:
Gissot Samuel
;
BenMoussa Ali
;
Giordanengo Boris
;
Soltani Ali
;
Saito Takashi
;
Schuhle Udo
;
Kroth Udo
;
Gottwald Alexander
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
aluminium compounds;
calibration;
metal-semiconductor-metal structures;
optical filters;
p-i-n diodes;
photodetectors;
radiation hardening (electronics);
radioastronomy;
radiometers;
wide band gap semiconductors;
UV LED;
WBGS based-photodetector;
aluminum nitride;
calibration strategy;
diamond-based PIN photodetectors;
electron volt energy 14.4 MeV;
flying mission;
ground irradiation campaigns;
metal-semiconductor-metal;
next generation solar UV radiometers;
optical front filters;
radiation hardness;
silicon photodio;
42.
Compendium of TID Comparative Results under X-Ray, Gamma and LINAC Irradiation
机译:
X射线,γ和LINAC辐照下TID比较结果简编
作者:
Kessarinskiy Leonid N.
;
Boychenko Dmitry V.
;
Petrov Andrey G.
;
Nekrasov Pavel V.
;
Sogoyan Armen V.
;
Anashin Vasily S.
;
Chubunov Pavel /A/.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
X-ray effects;
gamma-ray effects;
radiation hardening (electronics);
LINAC irradiation;
TID comparative compendium;
TID testing approach;
X-ray irradiation;
gamma irradiation;
Calibration;
Employment;
Integrated circuits;
Joints;
Radiation effects;
Testing;
Threshold voltage;
43.
Displacement Damage Testing Results for Intersil Bipolar and BiCMOS Analog Parts
机译:
Intersil双极和BiCMOS模拟零件的位移损坏测试结果
作者:
van Vonno N.W.
;
Shick J.E.
;
Traynham P.W.
;
Ballou F.C.
;
Gill J.S.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
BiCMOS analogue integrated circuits;
comparators (circuits);
integrated circuit testing;
reference circuits;
BiCMOS analog functions;
DD testing;
Intersil bipolar functions;
comparators;
electron volt energy 1 MeV;
load regulators;
neutron displacement damage testing;
power management functions;
voltage references;
BiCMOS integrated circuits;
Field effect transistors;
Neutrons;
Propagation delay;
Radiation effects;
Resistance;
Testing;
44.
Effects of gamma-Ray Radiation on Magnetic Properties of NdFeB and SmCo Permanent Magnets for Space Applications
机译:
伽马射线辐射对NdFeB和SmCo永磁体在空间应用中的磁性能的影响
作者:
Mesa Jose L.
;
Fernandez Ana B.
;
Hernando C.
;
McHenry Michael E.
;
Aroca Claudio
;
Alvarez Maria T.
;
Diaz-Michelena Marina
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
gamma-rays;
iron compounds;
neodymium compounds;
permanent magnets;
space vehicles;
NdFeB;
SmCo;
gamma-ray radiation;
high radiation environments;
magnetic properties;
permanent magnets;
space applications;
total irradiation doses;
Magnetic moments;
Magnetic properties;
Magnetization;
Permanent magnets;
Radiation effects;
Temperature;
Temperature measurement;
45.
Enhanced Low Dose Rate Sensitivity Analysis
机译:
增强的低剂量率敏感性分析
作者:
Nunez David
;
Poizat Marc
;
Jimenez Joaquin
;
Munoz Eugenio
;
Dominguez Manuel
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
radiation effects;
semiconductor device testing;
sensitivity analysis;
biasing condition;
bipolar technology;
degradation factor;
dose rate;
irradiation;
sensitivity analysis;
space system;
test condition;
Degradation;
Electronic components;
Europe;
Postal services;
Radiation effects;
Sensitivity analysis;
Testing;
46.
First Successful SEE Measurements with Heavy Ions in Brazil
机译:
巴西首次成功的重离子SEE测量
作者:
Medina N.H.
;
Silveira M.A.G.
;
Added N.
;
Aguiar V.A.P.
;
Giacomini Renato
;
Macchione E.L.A.
;
de Melo M.A.A.
;
Santos R.B.B.
;
Seixas L.E.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
MOSFET;
Rutherford backscattering;
carbon;
chlorine;
copper;
fluorine;
ion accelerators;
ion beams;
oxygen;
radiation hardening (electronics);
semiconductor device testing;
silicon;
silver;
two-dimensional hole gas;
Ag;
Brazil;
C;
Cl;
Cu;
F;
O;
Rutherford scattering;
SEE measurement;
São Paulo 8 UD Pelletron accelerator;
Si;
gold foil;
heavy ion beam;
irradiation;
off-the-shelf transistor testing;
pMOS transistor;
single event effect;
Ion beams;
Ions;
MOSFET;
Radiation effects;
Scattering;
Silicon;
47.
Guide to the 2013 IEEE Radiation Effects Data Workshop Record
机译:
2013 IEEE辐射效应数据研讨会记录指南
作者:
Hiemstra David M.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
Conferences;
MOSFET;
Operational amplifiers;
Protons;
Radiation effects;
Regulators;
Voltage control;
48.
Investigation of the Cosine Law for Lateral Power MOSFETs
机译:
横向功率MOSFET的余弦定律研究
作者:
Scheick Leif Z.
;
Edmonds Larry
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
power MOSFET;
radiation hardening (electronics);
semiconductor device testing;
SEE testing;
cosine law;
lateral power MOSFETs;
single event effect;
Conferences;
Ions;
Logic gates;
MOSFET;
Radiation effects;
Testing;
Xenon;
49.
Mirage: A New Proton Facility for the Study of Direct Ionization in Sub-100nm Technologies
机译:
Mirage:用于研究亚100nm技术中直接电离的新质子设备
作者:
Duzellier S.
;
Hubert Guillaume
;
Rey R.
;
Bezerra F.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
integrated optics;
proton beams;
radiation effects;
Mirage;
ONERA;
advanced digital technology;
direct ionization effect;
optoelectronics;
photonics;
proton beam line;
proton facility;
radiation effect;
Current measurement;
Ionization;
PIN photodiodes;
Particle beams;
Protons;
Silicon;
Standards;
50.
SEE Test Results of Electronic Components Performed on Roscosmos Test Facilities
机译:
在Roscosmos测试设备上执行的电子元件的SEE测试结果
作者:
Anashin Vasily S.
;
Koziukov Aleksandr E.
;
Kazyakin Anatoly /A/.
;
Kuznetsov Alexander S.
;
Bakirov Linaris R.
;
Korolev Viacheslav S.
;
Artemyev Kirill /A/.
;
Faradian Konstantin Zh
会议名称:
《》
|
2014年
关键词:
aerospace test facilities;
radiation hardening (electronics);
space vehicle electronics;
Roscosmos test facilities;
SEE test;
SETs;
electronic component hardness level;
satellite equipment;
CMOS integrated circuits;
Cyclotrons;
Electronic components;
Inspection;
Radiation effects;
Test facilities;
51.
Single Event Effects in Power MOSFETs and IGBTs Due to 14 MeV and 25 meV Neutrons
机译:
14 MeV和25 meV中子对功率MOSFET和IGBT的单事件影响
作者:
Lambert Damien
;
Desnoyers Francois
;
Thouvenot Didier
;
Azais Bruno
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
insulated gate bipolar transistors;
power MOSFET;
radiation hardening (electronics);
IGBT;
SEE characterizations;
commercial power electronic components;
electron volt energy 14 MeV;
electron volt energy 25 meV;
insulated gate bipolar transistors;
power MOSFET;
power metal-oxide-semiconductor field effect transistors;
single event effects;
Aerospace electronics;
Guidelines;
Insulated gate bipolar transistors;
MOSFET;
Neutrons;
Safety;
Standards;
52.
Single Event Upset Characterization of the Kintex-7 Field Programmable Gate Array Using Proton Irradiation
机译:
使用质子辐照对Kintex-7现场可编程门阵列进行单事件翻转表征
作者:
Hiemstra David M.
;
Kirischian Valeri
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
SRAM chips;
field programmable gate arrays;
radiation hardening (electronics);
FPGA;
Kintex-7 field programmable gate array;
SRAM;
certain functional blocks;
proton induced SEU cross-sections;
proton irradiation;
single event upset characterization;
space radiation environment;
upset rates;
Field programmable gate arrays;
Logic gates;
Performance evaluation;
Protons;
Radiation effects;
Random access memory;
Single event upsets;
53.
Single-Event and Radiation Effect on Enhancement Mode Gallium Nitride FETs
机译:
单事件和辐射效应对增强模式氮化镓FET的影响
作者:
Lidow A.
;
Nakata A.
;
Rearwin M.
;
Strydom J.
;
Zafrani A.M.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
III-V semiconductors;
field effect transistors;
gallium compounds;
radiation hardening (electronics);
wide band gap semiconductors;
ELDR immunity;
GaN;
LET;
displacement damage immunity;
enhancement mode FET;
low dose testing immunity;
radiation effect;
single-event effect;
space radiation conditions;
Field effect transistors;
Gallium nitride;
Logic gates;
Neutrons;
Power conversion;
Silicon;
Testing;
54.
Single-Event Effects in Low-Cost, Low-Power Microprocessors
机译:
低成本,低功耗微处理器中的单事件效果
作者:
Quinn Heather
;
Fairbanks Tom
;
Tripp Justin L.
;
Duran George
;
Lopez B.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
integrated circuit testing;
low-power electronics;
microcontrollers;
radiation hardening (electronics);
space vehicle electronics;
ARMs;
embedded computing;
low-cost low-power microprocessors;
microcontrollers;
nonmission-critical computational tasks;
radiation environment;
radiation testing;
single-event effects;
space-grade microprocessors;
Computer architecture;
Microprocessors;
Neutrons;
Nonvolatile memory;
Program processors;
Random access memory;
55.
Terrestrial Neutron Induced Failure in Silicon Carbide Power MOSFETs
机译:
地球中子诱发的碳化硅功率MOSFET失效
作者:
Rashed Kazi
;
Wilkins Richard
;
Akturk A.
;
Dwivedi R.C.
;
Gersey B.B.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
failure analysis;
neutrons;
power MOSFET;
probability;
semiconductor device reliability;
silicon compounds;
wide band gap semiconductors;
Cree CMF10120D;
SiC;
current 24 A;
drain bias;
failure probability;
metal-oxide-semiconductor field-effect transistor;
silicon carbide power MOSFET;
single event catastrophic failure;
stress voltage;
terrestrial neutron induced failure;
voltage 1200 V;
Aerospace electronics;
MOSFET;
Neutrons;
Radiation effects;
Sea level;
Silicon carbide;
Stress;
56.
TID and SEE Characterization of Rad-Hardened 1.2GHz PLL IP from New ST CMOS 65nm Space Technology
机译:
新型ST CMOS 65nm空间技术对防辐射1.2GHz PLL IP的TID和SEE表征
作者:
Malou Florence
;
Gasiot Gilles
;
Chevallier Remy
;
Dugoujon Laurent
;
Roche Philippe
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
CMOS analogue integrated circuits;
UHF integrated circuits;
industrial property;
phase locked loops;
radiation hardening (electronics);
SEE characterization;
ST CMOS space technology;
TID characterization;
cold-spare I-O;
frequency 1.2 GHz;
intellectual property;
phase-locked loop;
rad-hardened PLL IP;
CMOS integrated circuits;
CMOS technology;
Clocks;
Phase locked loops;
Protons;
Standards;
Temperature measurement;
57.
Total Dose and Single Event Effects Testing of the Intersil ISL71090SEH and ISL71091SEH Precision Voltage References
机译:
Intersil ISL71090SEH和ISL71091SEH精密电压基准的总剂量和单事件效应测试
作者:
van Vonno N.W.
;
Williams Barry
;
Turner S.D.
;
Thomson E.J.
;
Bernard S.K.
;
Goodhew D.N.
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
circuit testing;
radiation hardening (electronics);
reference circuits;
ISL71091SEH precision voltage references;
Intersil ISL71090SEH;
SEE;
electrical specifications;
fabrication process;
hardened voltage references;
high dose rate total dose testing;
single event effects testing;
total dose effects testing;
Accuracy;
Annealing;
Noise;
Performance evaluation;
Pins;
Radiation effects;
Testing;
58.
Total Dose Radiation Effects on COTS Array CCDs at Low Dose Rate
机译:
低剂量率对COTS阵列CCD的总剂量辐射效应
作者:
Wang Zujun
;
Xiao Zhigang
;
He Baoping
;
Huang Shaoyan
;
Tang Benqi
;
Liu Minbo
会议名称:
《2014 IEEE Radiation Effects Data Workshop》
|
2014年
关键词:
CCD image sensors;
image resolution;
radiation hardening (electronics);
sensor arrays;
CCD camera;
COTS array;
charge-coupled device;
dark signal slope;
fixed pattern noise;
image resolution;
saturation output signal voltage;
total dose radiation effect;
Arrays;
Charge coupled devices;
Image resolution;
Noise;
Radiation effects;
Signal resolution;
Voltage measurement;
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