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Microscope system, microscope system detection unit and method for microscopically imaging a sample

机译:显微镜系统,显微镜系统检测单元和用于对样品进行显微成像的方法

摘要

A microscope system (200) for imaging a sample (213) is proposed, comprising a detection unit (201) which has a beam splitter arrangement (100) with a plurality of beam splitters (AG) and with a lighting unit (211) which illuminates the sample (213), wherein the microscope system (200) irradiates sample light, which is emitted from the sample (213) due to the irradiation of the illumination light, into the beam splitter arrangement (100) and the beam splitter arrangement (100) irradiates the light into the Beam splitter assembly (100) irradiated sample light by means of one or more of the beam splitter (AG), which is or are each arranged in an operative position or are divided into different light components and at least part of the different light components separated from the beam splitter assembly (100) emits. It is provided that the beam splitter arrangement (100) comprises adjusting means (V) which, in accordance with an activation, or at least one of the plurality of beam splitter (AG), which is or are respectively arranged in its or their operative position, from the respective operative position bring and instead bring one or more other beam splitter (AG) and / or one or more other optical elements (X) in the respective active position, wherein the microscope system (200) detects frame data, the separately from the beam splitter assembly (100) radiated light components correspond. A detection unit for coupling to a corresponding microscope system (200) and a method for microscopically imaging a sample (213) are likewise subject matter of the present invention.
机译:提出了一种用于对样本(213)成像的显微镜系统(200),其包括检测单元(201),该检测单元具有分束器装置(100),该分束器装置具有多个分束器(AG)和照明单元(211),照射样品(213),其中显微镜系统(200)将由于照射光而从样品(213)发出的样品光照射到分束器装置(100)和分束器装置( 100)借助于一个或多个分束器(AG)将光照射到分束器组件(100)中,该分束器(一个或多个)分别布置在工作位置或被分成不同的光分量,并且至少与分束器组件(100)分开的不同光分量的一部分发出。提供的是,分束器装置(100)包括调节装置(V),该调节装置(V)根据激活或者多个或多个分束器(AG)中的至少一个以其或它们的工作方式布置。从相应的操作位置将一个或多个其他分束器(AG)和/或一个或多个其他光学元件(X)从相应的操作位置带到相应的活动位置,其中显微镜系统(200)检测帧数据,与分束器组件(100)分开的是对应的辐射光分量。同样,用于耦合至相应的显微镜系统(200)的检测单元和用于对样品进行显微成像的方法(213)也是本发明的主题。

著录项

  • 公开/公告号DE102018129833A1

    专利类型

  • 公开/公告日2019-06-06

    原文格式PDF

  • 申请/专利权人 LEICA MICROSYSTEMS CMS GMBH;

    申请/专利号DE201810129833

  • 发明设计人 FLORIAN FAHRBACH;

    申请日2018-11-26

  • 分类号G02B21/18;G02B21/06;G02B21/24;G02B21/36;G02B27/10;G01N21/64;

  • 国家 DE

  • 入库时间 2022-08-21 11:44:41

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