Microscope system, detection unit for microscope system and method for microscopic imaging of a sample

摘要

Microscope system (200) for imaging a sample (213), with a detection unit (201), which has a beam splitter arrangement (100) with a first beam splitter (A), a second beam splitter (B) and a third beam splitter (C), and with an illumination unit (211) which irradiates illumination light onto the sample (213), the microscope system (200) sample light (a) which is emitted from the sample (213) due to the irradiation of the illumination light onto the sample (213) in the beam splitter arrangement (100) shines in, - the beam splitter arrangement (100) splits the sample light (a) radiated into the beam splitter arrangement (100) into different light components (dg) by means of the beam splitters (A-C), which are each arranged in an effective position, and emits the different light components (dg) at the same time and separately from one another from the beam splitter arrangement (100), - the first beam splitter (A) at its active position by beam splitting on a beam splitter layer (S) of the first beam splitter (A) emits the first light beam (b) via a first exit surface from the first beam splitter (A) and shines into the second beam splitter (B) at its active position, and a second light beam formed by the beam splitting ( c) emits from the first beam splitter (A) via a second exit surface and into the third beam splitter (B) at its effective position, - the beam splitters (AC) each comprise two prisms (P1, P2) with prism surfaces, between which the respective beam splitter layer (S) is arranged, - the two prisms comprise a first prism (P2) in the form of a triangular prism and a second prism (P1) having five prism surfaces, with normal to the five prism surfaces of the second prism (P1) lying in a common plane , - The beam splitter arrangement (100) has adjusting means (V) which, according to a control, at least one of the beam splitters (AC), ie e are each arranged in their active position, bring them out of the respective active position and instead bring one or more other beam splitters (AC) and / or one or more other optical elements (X) into the respective active position, and - the microscope system (200) captures single image data which correspond to the light components (dg) emitted separately from one another from the beam splitter arrangement (100).