A high purity copper-cobalt alloy sputtering target containing 0.1 to 20 at% of Co, and remainder being Cu and unavoidable impurities, wherein a size (dimension) of precipitates in the target structure is 10 µm or less, and a number of precipitates is 500 precipitates/mm 2 or less. It is thereby possible to provide a high purity copper-cobalt alloy sputtering target capable of inhibiting the generation of particles during sputtering, and in particular improving the yield and reliability of semiconductor products that are being subject to further miniaturization and higher integration.
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机译:一种高纯度铜钴合金溅射靶,其含有0.1至20 at%的Co,且其余为Cu和不可避免的杂质,其中靶结构中析出物的尺寸(尺寸)为10 µm以下,且析出物的数量为500个沉淀物/ mm 2以下。因此,可以提供一种高纯度的铜钴合金溅射靶,该靶能够抑制溅射时的粒子的产生,特别是能够提高半导体产品的成品率和可靠性,该半导体产品正在进一步小型化和高集成化。
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