APPARATUS FOR PREDICTION OF THE RESIDUAL LIFETIME OF AN ELECTRICAL SYSTEM

摘要

The present invention relates to an apparatus (10) for prediction of the residual lifetime of an electrical system: The apparatus has an input unit (20), a processing unit (30), and an output unit (40). The input unit is configured to provide at least one sensor data from at least one sensor to the processing unit. The at least one the sensor data comprises the measurement of at least one physical parameter of at least one component of an electrical system. Each sensor data is associated with a corresponding sensor and relates to the measurement of one physical parameter of a corresponding component of the electrical system. Each sensor data extends over a plurality of time windows and is assigned to a certain data class, such that sensor data at a particular time window has a value that falls into one of the data classes defined by being between a minimum and maximum value defined for the respective data class. For each sensor data the processing unit is configured to assign the sensor data at each time window into a corresponding measurement window on the basis that sensor data at a particular time window has a value that falls into that corresponding data class. For each physical parameter of a component the processing unit is configured to determine a load spectrum, wherein the load spectrum is the sum of all data classes including the tata values and duration in each data class for the corresponding physical parameter of a component. The processing unit is configured to determine a predicted lifetime for the component through application of an aging model from at least one aging model to the corresponding load spectrum for each physical parameter of a component. The processing unit is configured to determine a predicted lifetime for each component of the at least one component.