Inspection system, inspection method and inspection image analysis method

摘要

PROBLEM TO BE SOLVED: To provide an inspection technique capable of improving inspection accuracy by improving learning efficiency of image analysis. An inspection system 1 has a learning image acquisition unit 5 that acquires a learning image G1 including development developments T, B, D, and N that appear according to a state of an object to be inspected, and learning. The learning image G1 is divided and divided so that the output development specifying unit 6 for specifying the output development T, B, D, N included in the image G1 and at least one output development T, B, D, N are included. The divided image generation unit 8 that generates G2 to G12, the index setting unit 9 that sets the index corresponding to the development T, B, D, and N included in the divided images G2 to G12, and the index is the divided image G2 to G12. It includes a learning data generation unit 10 that generates learning data associated with, a learning unit 11 that learns image analysis based on the learning data, and a learning model output unit 12 that outputs a learning model by learning. .. [Selection diagram] Fig. 1