首页> 外国专利> FEATURE QUANTITY EXTRACTION DEVICE, FAILURE SIGN DIAGNOSIS DEVICE, DESIGN SUPPORT DEVICE, AND FAILURE SIGN DIAGNOSIS OPERATION METHOD

FEATURE QUANTITY EXTRACTION DEVICE, FAILURE SIGN DIAGNOSIS DEVICE, DESIGN SUPPORT DEVICE, AND FAILURE SIGN DIAGNOSIS OPERATION METHOD

机译:特征量提取装置,故障征兆诊断装置,设计支持装置以及故障征兆诊断方法

摘要

To provide a feature quantity extraction device, a failure sign diagnosis device, a design support device, and a failure sign diagnosis operation method suitable for diagnosing a failure of a device in a predictive manner.SOLUTION: A feature quantity extraction device that obtains data from a sensor attached to a device to be diagnosed and outputs a feature quantity after pre-processing, includes: a reconfigurable circuit for inputting data from the sensor; an operation unit; a reconfigured information database for storing reconfigured information; and a communication module for external connection. The operation unit externally outputs the feature quantity obtained by executing the pre-processing of the data from the sensor using the reconfigurable circuit and the feature quantity extracting process by the communication module, stores the reconfigured information obtained from the outside in the reconfigured information database, and configures the reconfigurable circuit according to the reconfigured information.SELECTED DRAWING: Figure 1
机译:为了提供一种特征量提取装置,故障征兆诊断装置,设计支持装置以及故障征兆诊断操作方法,其适于以预测方式诊断设备的故障。传感器,其附接到待诊断的设备并在预处理之后输出特征量,包括:可重构电路,用于从传感器输入数据;以及操作单元;重配置信息数据库,用于存储重配置信息;以及用于外部连接的通信模块。运算单元从外部输出通过使用可重构电路对来自传感器的数据进行预处理以及通过通信模块进行的特征量提取处理而获得的特征量,将从外部获得的重构信息存储在重构信息数据库中,并根据重新配置的信息配置可重新配置的电路。

著录项

  • 公开/公告号JP2019211816A

    专利类型

  • 公开/公告日2019-12-12

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP20180104429

  • 发明设计人 UNUMA MUNETOSHI;KOMASU AKIHIRO;

    申请日2018-05-31

  • 分类号G05B23/02;

  • 国家 JP

  • 入库时间 2022-08-21 11:35:55

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