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Carrier for double-side polishing apparatus, double-side polishing apparatus, and double-side polishing method

机译:双面研磨装置用载体,双面研磨装置及双面研磨方法

摘要

A carrier for a double-side polishing apparatus configured to double-side polish providing a semiconductor silicon wafer. The carrier being disposed between upper and lower turn tables have a polishing pad attached, and includes a holding hole formed to hold the semiconductor silicon wafer between the upper and lower turn tables during polishing. The carrier for a double-side polishing apparatus is made of a resin. An average contact angle with pure water of front and back surfaces of the carrier, which come into contact with the polishing pads, is 45° or more and 60° or less, and a difference in average contact angles between the front surface and the back surface is 5° or less, which provides a carrier for a double-side polishing apparatus capable of enhancing the polishing rate for a semiconductor silicon wafer by using a resinous carrier; and a double-side polishing apparatus and method which employ the carrier.
机译:用于双面抛光设备的载体,其被配置为双面抛光以提供半导体硅晶片。布置在上下转台之间的载体具有附接的抛光垫,并且包括形成为在抛光期间将半导体硅晶片保持在上下转台之间的保持孔。双面抛光装置的载体由树脂制成。与抛光垫接触的载体的前表面和后表面与纯水的平均接触角为45°以上且60°以下,并且前表面和后表面之间的平均接触角之差表面为5°或更小,从而提供了用于双面抛光装置的载体,该载体能够通过使用树脂载体来提高对半导体硅晶片的抛光速率。以及使用载体的双面抛光装置和方法。

著录项

  • 公开/公告号JP6652202B2

    专利类型

  • 公开/公告日2020-02-19

    原文格式PDF

  • 申请/专利权人 信越半導体株式会社;

    申请/专利号JP20180554877

  • 发明设计人 田中 佑宜;北爪 大地;

    申请日2017-11-10

  • 分类号H01L21/304;B24B37/28;B24B37/08;B24B37;B24B57/02;

  • 国家 JP

  • 入库时间 2022-08-21 11:32:46

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