首页> 外国专利> INSPECTION RESULT PRESENTATION DEVICE, INSPECTION RESULT PRESENTATION METHOD, AND INSPECTION RESULT PRESENTATION PROGRAM

INSPECTION RESULT PRESENTATION DEVICE, INSPECTION RESULT PRESENTATION METHOD, AND INSPECTION RESULT PRESENTATION PROGRAM

机译:检查结果表示装置,检查结果表示方法以及检查结果表示程序

摘要

To provide an inspection result presentation device that can achieve an environment in which one or more thresholds for defect determination can be more easily determined.SOLUTION: An inspection result presentation device determines a predetermined feature quantity at each position of a surface to be inspected of an object to be inspected on the basis of image data of the surface to be inspected, compares the determined feature quantity at each position with one or more thresholds to specify a first direction position and the feature quantity of each defect present on the surface to be inspected, and on the basis of inspection result information generated through inspection result information generation processing of generating inspection result information including the specified first direction position and the feature quantity of each defect and the one or more thresholds, creating a graph indicating the relationship between the first direction position and the feature quantity of each defect and the one or more thresholds and presents the graph to a user.SELECTED DRAWING: Figure 1
机译:为了提供一种检查结果提示装置,该检查结果提示装置可以实现一种环境,在该环境中可以更容易地确定一个或多个用于确定缺陷的阈值。基于被检查表面的图像数据的被检查对象,将在每个位置处确定的特征量与一个或多个阈值进行比较,以指定第一方向位置和在被检查表面上存在的每个缺陷的特征量根据通过检查结果信息生成处理生成的检查结果信息,生成包括指定的第一方向位置,各缺陷的特征量和一个或多个阈值的检查结果信息,生成表示第一e的方向位置和特征量每个缺陷和一个或多个阈值,并将图形呈现给用户。选定的图纸:图1

著录项

  • 公开/公告号JP2020003412A

    专利类型

  • 公开/公告日2020-01-09

    原文格式PDF

  • 申请/专利权人 OMRON CORP;

    申请/专利号JP20180124963

  • 发明设计人 OGINO YUKI;

    申请日2018-06-29

  • 分类号G01N21/88;G01N21/892;

  • 国家 JP

  • 入库时间 2022-08-21 11:32:08

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号