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Delay time detection circuit, embossing information generation device, and delay time detection method

机译:延迟时间检测电路,压纹信息生成装置以及延迟时间检测方法

摘要

PROBLEM TO BE SOLVED: To provide an apparatus for generating highly accurate time information by a simple logic circuit. A delay time detection circuit includes a clock generation unit 11, a count unit 12, a vernier scale signal generation unit 13, and a delay time calculation unit. The clock generation unit 11 generates a vernier clock signal based on the system clock signal. The count unit 12 generates a count signal by sequentially and repeatedly incrementing a preset count number based on the vernier clock signal. The vernier scale signal generation unit 13 receives the count signal, and counts the vernier scale signal having a rectangular wave for a period corresponding to the second cycle at a rate of once in the count number and having a timing shift according to the second cycle. Generate as many as. The delay time calculation unit 14 receives the input clock signal and calculates the delay time within the range of the first cycle of the input clock signal with respect to the system clock signal based on the one scale signal having the timing that matches the input clock signal. To do. [Selection diagram] Fig. 1
机译:解决的问题:提供一种通过简单的逻辑电路生成高精度时间信息的装置。延迟时间检测电路包括时钟生成单元11,计数单元12,游标信号生成单元13和延迟时间计算单元。时钟产生单元11基于系统时钟信号产生游标时钟信号。计数单元12通过基于游标时钟信号顺序地且重复地递增预设计数数来产生计数信号。游标尺信号生成单元13接收计数信号,并且以与计数周期相对应的次数以一次计数的速率对具有矩形波的游标尺信号进行计数,该周期对应于第二周期,并且具有根据第二周期的定时偏移。产生尽可能多的。延迟时间计算单元14接收输入时钟信号,并基于具有与输入时钟信号匹配的定时的一个标度信号,计算相对于系统时钟信号在输入时钟信号的第一周期的范围内的延迟时间。 。去做。 [选择图]图1

著录项

  • 公开/公告号JP6659057B1

    专利类型

  • 公开/公告日2020-03-04

    原文格式PDF

  • 申请/专利号JP20180212047

  • 发明设计人 高橋 正行;

    申请日2018-11-12

  • 分类号G04F10/06;G04G5;H03K5/26;

  • 国家 JP

  • 入库时间 2022-08-21 11:32:02

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