首页> 外国专利> Makeup trend analyzing apparatus, makeup trend analyzing method, and non-transitory computer-readable recording medium storing makeup trend analyzing program

Makeup trend analyzing apparatus, makeup trend analyzing method, and non-transitory computer-readable recording medium storing makeup trend analyzing program

机译:化妆趋势分析设备,化妆趋势分析方法和存储化妆趋势分析程序的非暂时性计算机可读记录介质

摘要

There are included a facial feature point acquiring unit that acquires a facial feature point within a makeup facial image that is an image of a face on which makeup is applied, a makeup feature point acquiring unit that acquires a makeup feature point within the makeup facial image, a makeup information generator that generates, based on the facial feature point and the makeup feature point, makeup information quantitatively indicating positional information of the makeup feature point in a face coordinate system that takes the facial feature point as a reference, a trend analyzer that analyzes the makeup information acquired from a plurality of the makeup facial images, and determines a makeup trend, and an analysis result output unit that performs an information output process according to a determination result of the makeup trend.
机译:包括面部特征点获取单元,该面部特征点获取单元获取作为应用了化妆的脸部图像的化妆面部图像中的面部特征点;化妆特征点获取单元,其获取化妆面部图像中的化妆特征点。一种化妆信息生成器,其基于所述面部特征点和所述化妆特征点,在以所述面部特征点为基准的面部坐标系中定量地表示所述化妆特征点的位置信息的化妆信息。分析从多个化妆面部图像获取的化妆信息,并确定化妆趋势,并且分析结果输出单元根据化妆趋势的确定结果进行信息输出处理。

著录项

  • 公开/公告号US10762333B2

    专利类型

  • 公开/公告日2020-09-01

    原文格式PDF

  • 申请/专利号US201815995167

  • 发明设计人 ICHIRO TAKEI;

    申请日2018-06-01

  • 分类号G06K9;G06T1;G06Q50/10;A45D44;

  • 国家 US

  • 入库时间 2022-08-21 11:29:21

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号