LEAKY MEMORY HOLE REPAIR AT FABRICATION JOINT

摘要

A memory array with a fabrication joint includes a controller configured to apply a detection voltage on a word line coupled to a plurality of bitlines, count a number of bitlines having a first type of response to the detection voltage, and on condition that the number of bitlines exceeds a configured value, program memory cells on at least one dummy word line adjacent to the fabrication joint with a particular threshold voltage.