首页> 外国专利> Metal-oxide semiconductor (MOS) standard cells employing electrically coupled source regions and supply rails to relax source-drain tip-to-tip spacing between adjacent MOS standard cells

Metal-oxide semiconductor (MOS) standard cells employing electrically coupled source regions and supply rails to relax source-drain tip-to-tip spacing between adjacent MOS standard cells

机译:金属氧化物半导体(MOS)标准单元,采用电耦合的源极区和供电轨,以放宽相邻MOS标准单元之间的源极-漏极尖端间距

摘要

Metal-oxide semiconductor (MOS) standard cells employing electrically coupled source regions and supply rails to relax source-drain tip-to-tip spacing between adjacent MOS standard cells are disclosed. In one aspect, a MOS standard cell includes supply rails disposed in a first metal layer and along respective axes in an X-axis direction. The MOS standard cell includes metal lines disposed in the first metal layer and along respective axes in the X-axis direction. The MOS standard cell includes a source region formed in a semiconductor substrate beneath the first metal layer and adjacent to a plane in an X-Z-axis direction disposed between a supply rail and the source region. The source region is electrically coupled to the corresponding supply rail. Forming the source region in this manner allows the MOS standard cell to be disposed adjacent to other MOS standard cells while achieving the minimum required source-drain tip-to-tip spacing.
机译:公开了金属氧化物半导体(MOS)标准单元,其采用电耦合的源极区和供电轨以缓和相邻MOS标准单元之间的源极-漏极尖端之间的间距。在一个方面,MOS标准单元包括设置在第一金属层中并且沿着X轴方向上的各个轴的供电轨。 MOS标准单元包括设置在第一金属层中并且沿着X轴方向上的各个轴的金属线。 MOS标准单元包括在第一金属层下方的半导体基板中形成的源极区,该源极区在X-Z轴方向上与平面相邻,该源极区设置在供电轨和源极区之间。源极区域电耦合到相应的供电轨。以这种方式形成源极区域允许MOS标准单元与其他MOS标准单元相邻设置,同时实现最小所需的源极-漏极尖端间距离。

著录项

  • 公开/公告号US10497702B2

    专利类型

  • 公开/公告日2019-12-03

    原文格式PDF

  • 申请/专利权人 QUALCOMM INCORPORATED;

    申请/专利号US201715487664

  • 申请日2017-04-14

  • 分类号H01L27/088;H01L23/528;H01L21/8234;H01L27/02;H01L29/06;

  • 国家 US

  • 入库时间 2022-08-21 11:25:15

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