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Apparatus and methods for determining an expected data age of memory cells
Apparatus and methods for determining an expected data age of memory cells
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机译:用于确定存储单元的预期数据寿命的设备和方法
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摘要
Methods of operating a memory including applying an intermediate read voltage to a selected access line for a read operation, adding noise to a sensing operation while applying the intermediate read voltage, determining a value indicative of a number of memory cells of a plurality of memory cells connected to the selected access line that are activated in response to applying the intermediate read voltage to the selected access line, and determining an expected data age of the plurality of memory cells in response to the value indicative of the number of memory cells of the plurality of memory cells that are activated in response to applying the intermediate read voltage to the selected access line.
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