首页> 外国专利> METHOD FOR TRACKING A MAGNET WITH AN ARRAY OF MAGNETOMETERS, COMPRISING A PHASE OF IDENTIFYING THE PRESENCE OF THE MAGNET AND OF A MAGNETIC DISTURBANCE

METHOD FOR TRACKING A MAGNET WITH AN ARRAY OF MAGNETOMETERS, COMPRISING A PHASE OF IDENTIFYING THE PRESENCE OF THE MAGNET AND OF A MAGNETIC DISTURBANCE

机译:用磁表阵列跟踪磁体的方法,包括确定磁体的存在和磁干扰的阶段

摘要

The present disclosure relates to a method for estimating the position of a magnet using a tracking device comprising an array of magnetometers (Mi), comprising phases of determining an initial state vector associated with the magnet, of measuring a useful magnetic field emitted by a magnetic element, of estimating a magnetic field generated by the magnet, of calculating a bias between the estimated magnetic field and the measured magnetic field, and of updating the state vector on the basis of the bias. The method also comprises an identifying phase comprising a step of identifying the absence of the magnet with respect to the array of magnetometers and, where appropriate, a step of identifying the magnetic element as being a magnetic disturbance.
机译:本发明涉及一种使用包括磁性计(M i )的阵列的跟踪装置来估计磁体的位置的方法,该跟踪装置包括确定与磁体相关的初始状态向量的阶段,该阶段涉及测量,磁性元件发出的有用磁场,估算磁体产生的磁场,计算估算磁场与测量磁场之间的偏差以及根据该偏差更新状态向量。该方法还包括识别阶段,该阶段包括相对于磁力计阵列识别磁体不存在的步骤以及在适当时识别磁性元件为磁干扰的步骤。

著录项

  • 公开/公告号US2020166668A1

    专利类型

  • 公开/公告日2020-05-28

    原文格式PDF

  • 申请/专利权人 ISKN;

    申请/专利号US201816618076

  • 发明设计人 JEAN-MARIE DUPRE LA TOUR;TRISTAN HAUTSON;

    申请日2018-05-29

  • 分类号G01V3/08;

  • 国家 US

  • 入库时间 2022-08-21 11:21:38

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